Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/113883
Title: | Van der Waals interface between high-κ dielectrics and 2D semiconductors | Authors: | He, J Zuo, Y Yang, T Zhu, T Yang, M |
Issue Date: | Feb-2025 | Source: | Frontiers of physics, Feb. 2025, v. 20, no.1, 014301 | Abstract: | Atomically thin two-dimensional (2D) semiconductors are attractive channel materials for next-generation field-effect transistors (FETs). The highperformance 2D electronics requires high-quality integration of highdielectrics, which however remains a significant challenge. In this minireview, we provide a brief introduction on recent progress in the van der Waals (vdW) integration of high- dielectrics onto 2D semiconductors. We first highlight the importance of high- dielectric integration for 2D FETs. Next, we summarize the recent breakthroughs in the various vdW integrations of high- dielectrics with 2D semiconductors, along with their interfaces’ properties. Additionally, we examine the quasi-vdW integration of conventional high- dielectrics onto 2D semiconductors. Finally, we discuss the challenges and potential future research directions in this field. | Keywords: | Two-dimensional semiconductor High-κ dielectrics van der Waals interface |
Publisher: | Higher Education Press | Journal: | Frontiers of physics | ISSN: | 2095-0462 | EISSN: | 2095-0470 | DOI: | 10.15302/frontphys.2025.014301 | Rights: | © Higher Education Press 2024 The following publication He, J., Zuo, Y., Yang, T., Zhu, T., & Yang, M. (2025). Van der Waals interface between high-κ dielectrics and 2D semiconductors. Frontiers of Physics, 20(1), 014301 is available at https://dx.doi.org/10.15302/frontphys.2025.014301. |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
He_High-Κ_Dielectrics_2D.pdf | Pre-Published version | 2.07 MB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.