Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/113883
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Department of Applied Physics | en_US |
| dc.contributor | Research Centre for Nanoscience and Nanotechnology | en_US |
| dc.creator | He, J | en_US |
| dc.creator | Zuo, Y | en_US |
| dc.creator | Yang, T | en_US |
| dc.creator | Zhu, T | en_US |
| dc.creator | Yang, M | en_US |
| dc.date.accessioned | 2025-06-27T06:24:46Z | - |
| dc.date.available | 2025-06-27T06:24:46Z | - |
| dc.identifier.issn | 2095-0462 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10397/113883 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Higher Education Press | en_US |
| dc.rights | © Higher Education Press 2024 | en_US |
| dc.rights | The following publication He, J., Zuo, Y., Yang, T., Zhu, T., & Yang, M. (2025). Van der Waals interface between high-κ dielectrics and 2D semiconductors. Frontiers of Physics, 20(1), 014301 is available at https://dx.doi.org/10.15302/frontphys.2025.014301. | en_US |
| dc.subject | Two-dimensional semiconductor | en_US |
| dc.subject | High-κ dielectrics | en_US |
| dc.subject | van der Waals interface | en_US |
| dc.title | Van der Waals interface between high-κ dielectrics and 2D semiconductors | en_US |
| dc.type | Journal/Magazine Article | en_US |
| dc.identifier.volume | 20 | en_US |
| dc.identifier.issue | 1 | en_US |
| dc.identifier.doi | 10.15302/frontphys.2025.014301 | en_US |
| dcterms.abstract | Atomically thin two-dimensional (2D) semiconductors are attractive channel materials for next-generation field-effect transistors (FETs). The highperformance 2D electronics requires high-quality integration of highdielectrics, which however remains a significant challenge. In this minireview, we provide a brief introduction on recent progress in the van der Waals (vdW) integration of high- dielectrics onto 2D semiconductors. We first highlight the importance of high- dielectric integration for 2D FETs. Next, we summarize the recent breakthroughs in the various vdW integrations of high- dielectrics with 2D semiconductors, along with their interfaces’ properties. Additionally, we examine the quasi-vdW integration of conventional high- dielectrics onto 2D semiconductors. Finally, we discuss the challenges and potential future research directions in this field. | en_US |
| dcterms.accessRights | open access | en_US |
| dcterms.bibliographicCitation | Frontiers of physics, Feb. 2025, v. 20, no.1, 014301 | en_US |
| dcterms.isPartOf | Frontiers of physics | en_US |
| dcterms.issued | 2025-02 | - |
| dc.identifier.eissn | 2095-0470 | en_US |
| dc.identifier.artn | 014301 | en_US |
| dc.description.validate | 202506 bcrc | en_US |
| dc.description.oa | Accepted Manuscript | en_US |
| dc.identifier.FolderNumber | a3719 | - |
| dc.identifier.SubFormID | 50847 | - |
| dc.description.fundingSource | RGC | en_US |
| dc.description.pubStatus | Published | en_US |
| dc.description.oaCategory | Green (AAM) | en_US |
| Appears in Collections: | Journal/Magazine Article | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| He_High-Κ_Dielectrics_2D.pdf | Pre-Published version | 2.07 MB | Adobe PDF | View/Open |
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