Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/109321
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Title: PCB soldering defect inspection using multitask learning under low data regimes
Authors: Tsang, SH
Suo, Z 
Chan, TTL
Nguyen, HT
Lun, DPK 
Issue Date: Dec-2023
Source: Advanced intelligent systems, Dec. 2023, v. 5, no. 12, 2300364
Abstract: To increase the reliability of the printed circuit board (PCB) manufacturing process, automated optical inspection is often employed for soldering defect detection. However, traditional approaches built on handcrafted features, predefined rules, or thresholds are often susceptible to the variation of the acquired images’ quality and give unstable performances. To solve this problem, a deep learning-based soldering defect detection method is developed in this article. Like many real-life deep learning applications, the number of available training samples is often limited. This creates a challenging low-data scenario, as deep learning typically requires massive data to perform well. To address this issue, a multitask learning model is proposed, namely, PCBMTL, that can simultaneously learn the classification and segmentation tasks under low-data regimes. By acquiring the segmentation knowledge, classification performance is substantially improved with few samples. To facilitate the study, a soldering defect image dataset, namely, PCBSPDefect, is built. It focuses on the dual in-line packages (DIP) at the PCB back side, DIP at the PCB front side, and flat flexible cables. Experimental results show that the proposed PCBMTL outperforms the best existing approaches by over 5–17% of average accuracy for different datasets.
Keywords: Automated optical inspection
Deep neural networks
Multitask learning
Printed circuit boards
Soldering defect detection
Publisher: Wiley-VCH Verlag GmbH & Co. KGaA
Journal: Advanced intelligent systems 
EISSN: 2640-4567
DOI: 10.1002/aisy.202300364
Rights: © 2023 The Authors. Advanced Intelligent Systems published by Wiley-VCH GmbH. This is an open access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits use, distributionand reproduction in any medium, provided the original work is properly cited.
The following publication Tsang, S., Suo, Z., Chan, T.T., Nguyen, H. and Lun, D.P. (2023), PCB Soldering Defect Inspection Using Multitask Learning under Low Data Regimes. Adv. Intell. Syst., 5: 2300364 is available at https://doi.org/10.1002/aisy.202300364.
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