Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/109321
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Electrical and Electronic Engineering | - |
dc.creator | Tsang, SH | - |
dc.creator | Suo, Z | - |
dc.creator | Chan, TTL | - |
dc.creator | Nguyen, HT | - |
dc.creator | Lun, DPK | - |
dc.date.accessioned | 2024-10-03T08:17:55Z | - |
dc.date.available | 2024-10-03T08:17:55Z | - |
dc.identifier.uri | http://hdl.handle.net/10397/109321 | - |
dc.language.iso | en | en_US |
dc.publisher | Wiley-VCH Verlag GmbH & Co. KGaA | en_US |
dc.rights | © 2023 The Authors. Advanced Intelligent Systems published by Wiley-VCH GmbH. This is an open access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits use, distributionand reproduction in any medium, provided the original work is properly cited. | en_US |
dc.rights | The following publication Tsang, S., Suo, Z., Chan, T.T., Nguyen, H. and Lun, D.P. (2023), PCB Soldering Defect Inspection Using Multitask Learning under Low Data Regimes. Adv. Intell. Syst., 5: 2300364 is available at https://doi.org/10.1002/aisy.202300364. | en_US |
dc.subject | Automated optical inspection | en_US |
dc.subject | Deep neural networks | en_US |
dc.subject | Multitask learning | en_US |
dc.subject | Printed circuit boards | en_US |
dc.subject | Soldering defect detection | en_US |
dc.title | PCB soldering defect inspection using multitask learning under low data regimes | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.identifier.volume | 5 | - |
dc.identifier.issue | 12 | - |
dc.identifier.doi | 10.1002/aisy.202300364 | - |
dcterms.abstract | To increase the reliability of the printed circuit board (PCB) manufacturing process, automated optical inspection is often employed for soldering defect detection. However, traditional approaches built on handcrafted features, predefined rules, or thresholds are often susceptible to the variation of the acquired images’ quality and give unstable performances. To solve this problem, a deep learning-based soldering defect detection method is developed in this article. Like many real-life deep learning applications, the number of available training samples is often limited. This creates a challenging low-data scenario, as deep learning typically requires massive data to perform well. To address this issue, a multitask learning model is proposed, namely, PCBMTL, that can simultaneously learn the classification and segmentation tasks under low-data regimes. By acquiring the segmentation knowledge, classification performance is substantially improved with few samples. To facilitate the study, a soldering defect image dataset, namely, PCBSPDefect, is built. It focuses on the dual in-line packages (DIP) at the PCB back side, DIP at the PCB front side, and flat flexible cables. Experimental results show that the proposed PCBMTL outperforms the best existing approaches by over 5–17% of average accuracy for different datasets. | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Advanced intelligent systems, Dec. 2023, v. 5, no. 12, 2300364 | - |
dcterms.isPartOf | Advanced intelligent systems | - |
dcterms.issued | 2023-12 | - |
dc.identifier.scopus | 2-s2.0-85171663117 | - |
dc.identifier.eissn | 2640-4567 | - |
dc.identifier.artn | 2300364 | - |
dc.description.validate | 202410 bcch | - |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | OA_Scopus/WOS | en_US |
dc.description.fundingSource | Others | en_US |
dc.description.fundingText | Centre for Advances in Reliability and Safety (CAiRS), AIR@InnoHK Research Cluster | en_US |
dc.description.pubStatus | Published | en_US |
dc.description.oaCategory | CC | en_US |
Appears in Collections: | Journal/Magazine Article |
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File | Description | Size | Format | |
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Tsang_PCB_Soldering_Defect.pdf | 845.62 kB | Adobe PDF | View/Open |
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