Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/94991
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dc.contributorSchool of Nursingen_US
dc.creatorTian, Xen_US
dc.creatorDeng, Zen_US
dc.creatorYing, Wen_US
dc.creatorChoi, KSen_US
dc.creatorWu, Den_US
dc.creatorQin, Ben_US
dc.creatorWang, Jen_US
dc.creatorShen, Hen_US
dc.creatorWang, Sen_US
dc.date.accessioned2022-09-08T05:11:01Z-
dc.date.available2022-09-08T05:11:01Z-
dc.identifier.issn1534-4320en_US
dc.identifier.urihttp://hdl.handle.net/10397/94991-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rights© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
dc.rightsThe following publication X. Tian et al., "Deep Multi-View Feature Learning for EEG-Based Epileptic Seizure Detection," in IEEE Transactions on Neural Systems and Rehabilitation Engineering, vol. 27, no. 10, pp. 1962-1972, Oct. 2019 is available at https://doi.org/10.1109/TNSRE.2019.2940485.en_US
dc.subjectEEGen_US
dc.subjectSeizure detectionen_US
dc.subjectMulti-viewen_US
dc.subjectFeature extractingen_US
dc.subjectDeep learningen_US
dc.titleDeep multi-view feature learning for EEG-based epileptic seizure detectionen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1962en_US
dc.identifier.epage1972en_US
dc.identifier.volume27en_US
dc.identifier.issue10en_US
dc.identifier.doi10.1109/TNSRE.2019.2940485en_US
dcterms.abstractEpilepsy is a neurological illness caused by abnormal discharge of brain neurons, where epileptic seizure can lead to life-threatening emergencies. By analyzing the encephalogram (EEG) signals of patients with epilepsy, their conditions can be monitored and seizure can be detected and intervened in time. As the identification of effective features in EEG signals is important for accurate seizure detection, this paper proposes a multi-view deep feature extraction method in attempt to achieve this goal. The method first uses fast Fourier transform (FFT) and wavelet packet decomposition (WPD) to construct the initial multi-view features. Convolutional neural network (CNN) is then used to automatically learn deep features from the initial multi-view features, which reduces the dimensionality and obtain the features with better seizure identification ability. Furthermore, the multi-view Takagi-Sugeno-Kang fuzzy system (MV-TSK-FS), an interpretable rule-based classifier, is used to construct a classification model with strong generalizability based on the deep multi-view features obtained. Experimental studies show that the classification accuracy of the proposed multi-view deep feature extraction method is at least 1% higher than that of common feature extraction methods such as principal component analysis (PCA), FFT and WPD. The classification accuracy is also at least 4% higher than the average accuracy achieved with single-view deep features.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationIEEE transactions on neural systems and rehabilitation engineering, Oct. 2019, v. 27, no. 10, 8832223, p. 1962-1972en_US
dcterms.isPartOfIEEE transactions on neural systems and rehabilitation engineeringen_US
dcterms.issued2019-10-
dc.identifier.isiWOS:000497685900003-
dc.identifier.scopus2-s2.0-85073663433-
dc.identifier.pmid31514144-
dc.identifier.eissn1558-0210en_US
dc.identifier.artn8832223en_US
dc.description.validate202209_bcwwen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberSN-0240-
dc.description.fundingSourceRGCen_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS20905397-
dc.description.oaCategoryGreen (AAM)en_US
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