Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/91594
PIRA download icon_1.1View/Download Full Text
Title: An AR-Assisted deep learning-based approach for automatic inspection of aviation connectors
Authors: Li, S
Zheng, P 
Zheng, L
Issue Date: Mar-2021
Source: IEEE transactions on industrial informatics, Mar. 2021, v. 17, no. 3, p. 1721-1731
Abstract: The mismatched pins inspection of the complex aviation connector is a critical process to ensure the correct wiring harness assembly, of which the existing manual operation is error-prone and time-consuming. Aiming to fill this gap, this article proposes an augmented reality (AR)-assisted deep learning-based approach to tackle three major challenges in the aviation connector inspection, including the small pins detection, multipins sequencing, and mismatched pins visualization. First, the proposed spatial-attention pyramid network approach extracts the image features in multilayers and searches for their spatial relationships among the images. Second, based on the cluster-generation sequencing algorithm, these detected pins are clustered into annuluses of expected layers and numbered according to their polar angles. Finally, the AR glass as the inspection visualization platform, highlights the mismatched pins in the augmented interface to warn the operators automatically. Compared with the other existing methodologies, the experimental result shows that the proposed approach can achieve better performance accuracy and support the operator's inspection process efficiently.
Keywords: Augmented reality (AR)
Aviation connector
Deep learning
Industrial inspection
Spatial-attention pyramid network
Publisher: Institute of Electrical and Electronics Engineers
Journal: IEEE transactions on industrial informatics 
ISSN: 1551-3203
EISSN: 1941-0050
DOI: 10.1109/TII.2020.3000870
Rights: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication S. Li, P. Zheng and L. Zheng, "An AR-Assisted Deep Learning-Based Approach for Automatic Inspection of Aviation Connectors," in IEEE Transactions on Industrial Informatics, vol. 17, no. 3, pp. 1721-1731, March 2021 is available at https://doi.org/10.1109/TII.2020.3000870
Appears in Collections:Journal/Magazine Article

Files in This Item:
File Description SizeFormat 
ALL_TII-19-5279.pdfPre-Published version3.71 MBAdobe PDFView/Open
Open Access Information
Status open access
File Version Final Accepted Manuscript
Access
View full-text via PolyU eLinks SFX Query
Show full item record

Page views

100
Last Week
1
Last month
Citations as of Apr 14, 2024

Downloads

257
Citations as of Apr 14, 2024

SCOPUSTM   
Citations

63
Citations as of Apr 19, 2024

WEB OF SCIENCETM
Citations

41
Citations as of Apr 18, 2024

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.