Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/91594
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Industrial and Systems Engineering | en_US |
dc.creator | Li, S | en_US |
dc.creator | Zheng, P | en_US |
dc.creator | Zheng, L | en_US |
dc.date.accessioned | 2021-11-09T08:13:21Z | - |
dc.date.available | 2021-11-09T08:13:21Z | - |
dc.identifier.issn | 1551-3203 | en_US |
dc.identifier.uri | http://hdl.handle.net/10397/91594 | - |
dc.language.iso | en | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
dc.rights | © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | en_US |
dc.rights | The following publication S. Li, P. Zheng and L. Zheng, "An AR-Assisted Deep Learning-Based Approach for Automatic Inspection of Aviation Connectors," in IEEE Transactions on Industrial Informatics, vol. 17, no. 3, pp. 1721-1731, March 2021 is available at https://doi.org/10.1109/TII.2020.3000870 | en_US |
dc.subject | Augmented reality (AR) | en_US |
dc.subject | Aviation connector | en_US |
dc.subject | Deep learning | en_US |
dc.subject | Industrial inspection | en_US |
dc.subject | Spatial-attention pyramid network | en_US |
dc.title | An AR-Assisted deep learning-based approach for automatic inspection of aviation connectors | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.identifier.spage | 1721 | en_US |
dc.identifier.epage | 1731 | en_US |
dc.identifier.volume | 17 | en_US |
dc.identifier.issue | 3 | en_US |
dc.identifier.doi | 10.1109/TII.2020.3000870 | en_US |
dcterms.abstract | The mismatched pins inspection of the complex aviation connector is a critical process to ensure the correct wiring harness assembly, of which the existing manual operation is error-prone and time-consuming. Aiming to fill this gap, this article proposes an augmented reality (AR)-assisted deep learning-based approach to tackle three major challenges in the aviation connector inspection, including the small pins detection, multipins sequencing, and mismatched pins visualization. First, the proposed spatial-attention pyramid network approach extracts the image features in multilayers and searches for their spatial relationships among the images. Second, based on the cluster-generation sequencing algorithm, these detected pins are clustered into annuluses of expected layers and numbered according to their polar angles. Finally, the AR glass as the inspection visualization platform, highlights the mismatched pins in the augmented interface to warn the operators automatically. Compared with the other existing methodologies, the experimental result shows that the proposed approach can achieve better performance accuracy and support the operator's inspection process efficiently. | en_US |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | IEEE transactions on industrial informatics, Mar. 2021, v. 17, no. 3, p. 1721-1731 | en_US |
dcterms.isPartOf | IEEE transactions on industrial informatics | en_US |
dcterms.issued | 2021-03 | - |
dc.identifier.isi | WOS:000597195500018 | - |
dc.identifier.eissn | 1941-0050 | en_US |
dc.description.validate | 202111 bchy | en_US |
dc.description.oa | Accepted Manuscript | en_US |
dc.identifier.FolderNumber | a1047-n08 | - |
dc.identifier.SubFormID | 43849 | - |
dc.description.fundingSource | Others | en_US |
dc.description.fundingText | This research is funded by the Civil Airplane Technology Development Program (MJ-2017-G-70), the Beijing Key Laboratory of Digital Design and Manufacturing Project, and the Departmental General Research Fund (G-UAHH) from the Research Committee of Hong Kong Polytechnic University, Hong Kong SAR | en_US |
dc.description.pubStatus | Published | en_US |
dc.description.oaCategory | Green (AAM) | en_US |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
ALL_TII-19-5279.pdf | Pre-Published version | 3.71 MB | Adobe PDF | View/Open |
Page views
150
Last Week
1
1
Last month
Citations as of Apr 14, 2025
Downloads
422
Citations as of Apr 14, 2025
SCOPUSTM
Citations
66
Citations as of Jul 4, 2024
WEB OF SCIENCETM
Citations
56
Citations as of May 8, 2025

Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.