Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/70606
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dc.contributorDepartment of Electronic and Information Engineeringen_US
dc.creatorZhang, Xen_US
dc.creatorLiu, Den_US
dc.creatorZhan, Cen_US
dc.creatorTse, CKen_US
dc.date.accessioned2017-12-28T06:17:30Z-
dc.date.available2017-12-28T06:17:30Z-
dc.identifier.issn2156-3357en_US
dc.identifier.urihttp://hdl.handle.net/10397/70606-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rights© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
dc.rightsThe following publication X. Zhang, D. Liu, C. Zhan and C. K. Tse, "Effects of Cyber Coupling on Cascading Failures in Power Systems," in IEEE Journal on Emerging and Selected Topics in Circuits and Systems, vol. 7, no. 2, pp. 228-238, June 2017 is available at https://doi.org/10.1109/JETCAS.2017.2698163.en_US
dc.subjectInterdependent infrastructuresen_US
dc.subjectCascading failureen_US
dc.subjectPower systemen_US
dc.subjectCyber attacken_US
dc.titleEffects of cyber coupling on cascading failures in power systemsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage228en_US
dc.identifier.epage238en_US
dc.identifier.volume7en_US
dc.identifier.issue2en_US
dc.identifier.doi10.1109/JETCAS.2017.2698163en_US
dcterms.abstractIn this paper, we propose a model to investigate the cascading failures in the coupled system (smart grid) that comprises a power grid and a coupling cyber network. In this model, we take into consideration the effects of power overloading, contagion, and interdependence between power grids and cyber networks on failure propagations in the coupled system, and then use a stochastic method to generate the time intervals between failures, thus producing the dynamic profile of the cascading failures caused by the attack of cyber malwares. We study several coupled systems generated by coupling the UIUC 150 Bus System with cyber networks of different structures and coupling patterns. Simulation results show that the dynamic profile of the cascading failures in a coupled system displays a "staircaselike" pattern which can be interpreted as a combined feature of the typical step propagation profile triggered repeatedly by cyber attacks due to network coupling. Results also show that cyber coupling can intensify both the extent and rapidity of power blackouts. Moreover, the cyber network structure and the coupling patterns affect the propagation of the cascading failures in smart grids. Scale-free cyber networks promote failure spreading, and the higher average cyber node degree also intensifies the spreading. Coupling power nodes with high-degree cyber nodes accelerates the failure propagation compared with random or low-degree couplings.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationIEEE journal on emerging and selected topics in circuits and systems, June 2017, v. 7, no. 2, p. 228-238en_US
dcterms.isPartOfIEEE journal on emerging and selected topics in circuits and systemsen_US
dcterms.issued2017-06-
dc.identifier.isiWOS:000403438900006-
dc.identifier.ros2016005622-
dc.identifier.rosgroupid2016005371-
dc.description.ros2016-2017 > Academic research: refereed > Publication in refereed journalen_US
dc.description.validatebcrcen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberRGC-B3-1003-
dc.description.fundingSourceRGCen_US
dc.description.pubStatusPublisheden_US
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