Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/6565
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dc.contributorDepartment of Electrical Engineering-
dc.creatorLau, APT-
dc.creatorShen, TSR-
dc.creatorShieh, W-
dc.creatorHo, KP-
dc.date.accessioned2014-12-11T08:26:51Z-
dc.date.available2014-12-11T08:26:51Z-
dc.identifier.urihttp://hdl.handle.net/10397/6565-
dc.language.isoenen_US
dc.publisherOptical Society of Americaen_US
dc.rights© 2010 Optical Society of America. This paper was published in Optics express and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://www.opticsinfobase.org/abstract.cfm?URI=oe-18-16-17239. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.en_US
dc.subjectPhase noiseen_US
dc.subjectProbabilityen_US
dc.titleEqualization-enhanced phase noise for 100Gb/s transmission and beyond with coherent detectionen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage17239-
dc.identifier.epage17251-
dc.identifier.volume18-
dc.identifier.issue16-
dc.identifier.doi10.1364/OE.18.017239-
dcterms.abstractThe probability density function and impact of equalizationenhanced phase noise (EEPN) is analytically investigated and simulated for 100 Gb/s coherent systems using electronic dispersion compensation. EEPN impairment induces both phase noise and amplitude noise with the former twice as much as the latter. The effects of transmitter phase noise on EEPN are negligible for links with residual dispersion in excess of 700 ps/nm. Optimal linear equalizer in the presence of EEPN is derived but show only marginal performance improvement, indicating that EEPN is difficult to mitigate using simple DSP techniques. In addition, the effects of EEPN on carrier recovery techniques and corresponding cycle slip probabilities are studied.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationOptics express, 2 Aug. 2010, v. 18, no. 16, p. 17239-17251-
dcterms.isPartOfOptics express-
dcterms.issued2010-08-02-
dc.identifier.isiWOS:000281042400098-
dc.identifier.scopus2-s2.0-77955619692-
dc.identifier.eissn1094-4087-
dc.identifier.rosgroupidr54181-
dc.description.ros2010-2011 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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