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http://hdl.handle.net/10397/4984
Title: | Microscopic mechanism of leakage currents in silica junctions | Authors: | Luo, X Wang, B Zheng, Y |
Issue Date: | 1-Oct-2009 | Source: | Journal of applied physics, 1 Oct. 2009, v. 106, no. 7, 073711, p. 1-4 | Abstract: | Combining the nonequilibrium Green’s functions with the density-functional theory, we investigated the structural and electronic properties of silica junctions sandwiched between Al electrodes. The results show that the oxygen vacancies and tensile strain field play an important role in the electron transport properties of these two-probe systems. Sizable changes in leakage current across the barrier are found for the oxygen deficient system. It is found that Si dangling bonds formed by the introduction of oxygen vacancies are the main building blocks of the conduction channel in silica thin film. The midband gap states generated by the Si dangling bonds contribute to the leakage current. Detail analysis shows that four conduction channels are generated in silica junction after the presence of oxygen vacancies, resulting in a large enhancement of the electron transmission coefficient at the Fermi level. This leakage current mechanism provides useful information in the microelectronic designs. | Keywords: | Aluminium Dangling bonds Density functional theory Electrodes Energy gap Fermi level Green's function methods Leakage currents Metal-insulator boundaries Silicon compounds Tensile strength Thin films Vacancies (crystal) |
Publisher: | American Institute of Physics | Journal: | Journal of applied physics | ISSN: | 0021-8979 | EISSN: | 1089-7550 | DOI: | 10.1063/1.3236640 | Rights: | © 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X. Luo, B. Wang & Y. Zheng, J. Appl. Phys. 106, 073711 (2009) and may be found at http://link.aip.org/link/?jap/106/073711. |
Appears in Collections: | Journal/Magazine Article |
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Luo_Microscopic_mechanism_leakage.pdf | 1.07 MB | Adobe PDF | View/Open |
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