Substrate-induced strain effect in La₀.₈₇₅Ba₀.₁₂₅MnO₃ thin films grown on ferroelectric single-crystal substrates

Abstract

The authors have studied the substrate-induced strain effect in La[sub 0.875]Ba[sub 0.125]MnO₃ (LBMO) thin films grown on ferroelectric 0.67Pb(Mg[sub ⅓]Nb[sub ⅔]) O₃-0.33PbTiO₃ (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed.