Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/396
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Applied Physics | en_US |
dc.contributor | Materials Research Centre | en_US |
dc.creator | Zheng, RK | en_US |
dc.creator | Wang, Y | en_US |
dc.creator | Chan, HLW | en_US |
dc.creator | Choy, CL | en_US |
dc.creator | Luo, H | en_US |
dc.date.accessioned | 2014-12-11T08:27:32Z | - |
dc.date.available | 2014-12-11T08:27:32Z | - |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://hdl.handle.net/10397/396 | - |
dc.language.iso | en | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.rights | © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in R.K. Zheng et al. Appl. Phys. Lett. 92, 082908 (2008) and may be found at http://link.aip.org/link/?apl/92/082908 | en_US |
dc.subject | Barium compounds | en_US |
dc.subject | Dielectric polarisation | en_US |
dc.subject | Lanthanum compounds | en_US |
dc.subject | Piezoelectricity | en_US |
dc.subject | Stress effects | en_US |
dc.subject | Thin films | en_US |
dc.subject | X-ray diffraction | en_US |
dc.title | Substrate-induced strain effect in La₀.₈₇₅Ba₀.₁₂₅MnO₃ thin films grown on ferroelectric single-crystal substrates | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.identifier.spage | 1 | en_US |
dc.identifier.epage | 3 | en_US |
dc.identifier.volume | 92 | en_US |
dc.identifier.doi | 10.1063/1.2870100 | en_US |
dcterms.abstract | The authors have studied the substrate-induced strain effect in La[sub 0.875]Ba[sub 0.125]MnO₃ (LBMO) thin films grown on ferroelectric 0.67Pb(Mg[sub ⅓]Nb[sub ⅔]) O₃-0.33PbTiO₃ (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed. | en_US |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Applied physics letters, 25 Feb. 2008, v. 92, 082908, p. 1-3 | en_US |
dcterms.isPartOf | Applied physics letters | en_US |
dcterms.issued | 2008-02-25 | - |
dc.identifier.isi | WOS:000254297300070 | - |
dc.identifier.scopus | 2-s2.0-40049086387 | - |
dc.identifier.eissn | 1077-3118 | en_US |
dc.identifier.rosgroupid | r39668 | - |
dc.description.ros | 2007-2008 > Academic research: refereed > Publication in refereed journal | en_US |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | OA_IR/PIRA | - |
dc.description.pubStatus | Published | en_US |
dc.description.oaCategory | VoR allowed | en_US |
Appears in Collections: | Journal/Magazine Article |
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File | Description | Size | Format | |
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substrate_08.pdf | 335.61 kB | Adobe PDF | View/Open |
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