Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/111225
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Title: Slab waveguides and nanoscale patterning of pulsed laser-deposited Ge₀.₂Se₀.₈ chalcogenide films
Authors: Liu, WC 
Hoffman, G
Zhou, W
Reano, RM
Boolchand, P
Sooryakumar, R
Issue Date: 28-Jul-2008
Source: Applied physics letters, 28 July 2008, v. 93, no. 4, 041107, p. 041107-1 - 041107-3
Abstract: Planar slab waveguides were fabricated by pulsed laser deposition from GexSe1−x glass compounds with composition x 0.2 that lies very close to the floppy to rigid stiffness transition. These high quality active structures, which were deposited on SiO2 cladding layers above silicon substrates, support several transverse-electric TE modes, and a loss of 0.24 dB/cm for the TE0 mode was measured at 632.8 nm wavelength. The ability to exploit electron beam writing at these special Ge in Se compositions to create nanoscale surface motifs are promising advances to create unique miniature optical processing devices.
Publisher: AIP Publishing LLC
Journal: Applied physics letters 
ISSN: 0003-6951
EISSN: 1077-3118
DOI: 10.1063/1.2965124
Rights: © 2008 American Institute of Physics.
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Liu, W. C., Hoffman, G., Zhou, W., Reano, R. M., Boolchand, P., & Sooryakumar, R. (2008). Slab waveguides and nanoscale patterning of pulsed laser-deposited Ge0.2Se0.8 chalcogenide films. Applied Physics Letters, 93(4) and may be found at https://doi.org/10.1063/1.2965124.
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