Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/111217
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Title: Single electron tunneling and Coulomb blockade effect in HfAlO/Au nanocrystals/HfAlO trilayer nonvolatile memory structure
Authors: Chan, KC 
Lee, PF 
Dai, JY 
Issue Date: 7-Apr-2008
Source: Applied physics letters, 7 Apr. 2008, v. 92, no. 14, 143117, p. 143117-1 - 143117-3
Abstract: Single electron tunneling and Coulomb blockade effect have been observed in the HfAlO/Au nanocrystals/HfAlO trilayer floating gate nonvolatile memory structure. This trilayer floating gate memory structure exhibits a significant memory window, and resonant tunneling current peaks and Coulomb staircase are obtained at 20 K low temperature. Compared to the ordinary single electron devices, this is the first time that a clear single electron tunneling oscillation has been observed in the floating gate memory structure. This resonant tunneling phenomenon in floating gate memory may open a door toward application as single electron device.
Publisher: AIP Publishing LLC
Journal: Applied physics letters 
ISSN: 0003-6951
EISSN: 1077-3118
DOI: 10.1063/1.2908961
Rights: © 2008 American Institute of Physics.
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Chan, K. C., Lee, P. F., & Dai, J. Y. (2008). Single electron tunneling and Coulomb blockade effect in HfAlO∕Au nanocrystals/HfAlO trilayer nonvolatile memory structure. Applied Physics Letters, 92(14) and may be found at https://doi.org/10.1063/1.2908961.
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