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Title: Deep progressive convolutional neural network for blind super-resolution with multiple degradations
Authors: Xiao, J 
Zhao, R 
Lai, SC 
Jia, W 
Lam, KM 
Issue Date: 2019
Source: In Proceedings of 2019 IEEE International Conference on Image Processing (ICIP), 22-25 September 2019, Taipei, Taiwan, p. 2856-2860
Abstract: Blind super-resolution (SR) of blurry and noisy low-resolution (LR) images is still a challenging problem in single image super-resolution (SISR). The performance of most existing convolutional neural network (CNN)-based models is inevitably degraded when LR images are corrupted by both blur and noise. For those blind SR methods based on kernel estimation, accurate estimation is barely attained under complex degradations and this gives rise to poor-quality results. To address these problems, we propose a deep progressive network under a probabilistic framework and a novel up-sampling method for blind super-resolution with multiple degradations, which effectively utilizes image priors across scales. Experimental results show that the proposed method achieves promising performance on images with multiple degradations.
Keywords: Blind super-resolution
Deep progressive network
Publisher: Institute of Electrical and Electronics Engineers
ISBN: 978-1-5386-6249-6 (Electronic)
978-1-5386-6250-2 (Print on Demand(PoD))
DOI: 10.1109/ICIP.2019.8803251
Description: 2019 IEEE International Conference on Image Processing (ICIP), 22-25 September 2019, Taipei, Taiwan
Rights: ©2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication J. Xiao, R. Zhao, S. -C. Lai, W. Jia and K. -M. Lam, "Deep Progressive Convolutional Neural Network for Blind Super-Resolution With Multiple Degradations," 2019 IEEE International Conference on Image Processing (ICIP), Taipei, Taiwan, 2019, pp. 2856-2860 is available at https://doi.org/10.1109/ICIP.2019.8803251.
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