Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/106346
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dc.contributorDepartment of Mechanical Engineering-
dc.creatorLiang, D-
dc.creatorMa, X-
dc.creatorLiu, Z-
dc.creatorJafri, HM-
dc.creatorCao, G-
dc.creatorHuang, H-
dc.creatorShi, S-
dc.creatorChen, LQ-
dc.date.accessioned2024-05-09T00:52:55Z-
dc.date.available2024-05-09T00:52:55Z-
dc.identifier.urihttp://hdl.handle.net/10397/106346-
dc.language.isoenen_US
dc.publisherAIP Publishing LLCen_US
dc.rights© 2020 Author(s). This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.en_US
dc.rightsThe following article appeared in Deshan Liang, Xingqiao Ma, Zhuhong Liu, Hasnain Mehdi Jafri, Guoping Cao, Houbing Huang, Sanqiang Shi, Long-Qing Chen; Phase-field simulation of two-dimensional topological charges in nematic liquid crystals. J. Appl. Phys. 28 September 2020; 128 (12): 124701 and may be found at https://doi.org/10.1063/5.0021079.en_US
dc.titlePhase-field simulation of two-dimensional topological charges in nematic liquid crystalsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume128-
dc.identifier.issue12-
dc.identifier.doi10.1063/5.0021079-
dcterms.abstractThe concept of topological quantum number, or topological charge, has been used extensively to describe topological defects or solitons. Nematic liquid crystals contain both integer and half-integer topological defects, making them useful models for testing the rules that govern topological defects. Here, we investigated topological defects in nematic liquid crystals using the phase-field method. If there are no defects along a loop path, the total charge number is described by an encircled loop integral. We found that the total charge number is conserved, and the conservation of defects number is determined by a boundary during the generation and annihilation of positive–negative topological defects when the loop integral is confined. These rules can be extended to other two-dimensional systems with topological defects.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 28 Sept 2020, v. 128, no. 12, 124701-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2020-09-
dc.identifier.scopus2-s2.0-85092437125-
dc.identifier.eissn0021-8979-
dc.identifier.artn124701-
dc.description.validate202405 bcch-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberME-0194en_US
dc.description.fundingSourceOthersen_US
dc.description.fundingTextthe National Natural Science Foundation of Chinaen_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS30775063en_US
dc.description.oaCategoryVoR alloweden_US
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