Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/104528
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Department of Industrial and Systems Engineering | - |
| dc.creator | Sun, B | en_US |
| dc.creator | Jiang, X | en_US |
| dc.creator | Yung, KC | en_US |
| dc.creator | Fan, J | en_US |
| dc.creator | Pecht, MG | en_US |
| dc.date.accessioned | 2024-02-05T08:50:48Z | - |
| dc.date.available | 2024-02-05T08:50:48Z | - |
| dc.identifier.issn | 0885-8993 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10397/104528 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineers | en_US |
| dc.rights | © 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | en_US |
| dc.rights | The following publication Sun, B., Jiang, X., Yung, K.-C., Fan, J., & Pecht, M. G. (2017). A Review of Prognostic Techniques for High-Power White LEDs. IEEE Transactions on Power Electronics, 32(8), 6338–6362 is available at https://doi.org/10.1109/TPEL.2016.2618422. | en_US |
| dc.subject | Color shift | en_US |
| dc.subject | Data-driven (DD) | en_US |
| dc.subject | Light-emitting diodes (LEDs) | en_US |
| dc.subject | Lumen degradation | en_US |
| dc.subject | Physics of failure | en_US |
| dc.subject | Prognostics | en_US |
| dc.subject | Reliability | en_US |
| dc.title | A review of prognostic techniques for high-power white LEDs | en_US |
| dc.type | Journal/Magazine Article | en_US |
| dc.identifier.spage | 6338 | en_US |
| dc.identifier.epage | 6362 | en_US |
| dc.identifier.volume | 32 | en_US |
| dc.identifier.issue | 8 | en_US |
| dc.identifier.doi | 10.1109/TPEL.2016.2618422 | en_US |
| dcterms.abstract | High-power white light-emitting diodes (LEDs) have attracted much attention due to their versatility in a variety of applications and growing demand in markets such as general lighting, automotive lamps, communications devices, and medical devices. In particular, the need for high reliability and long lifetime poses new challenges for the research and development, production, and application of LED lighting. Accurate and effective prediction of the lifetime or reliability of LED lighting has emerged as one of the key issues in the solid-state lighting field. Prognostic is an engineering technology that predicts the future reliability or determines the remaining useful lifetime of a product by assessing the extent of deviation or degradation of a product from its expected normal operating conditions. Prognostics bring benefits to both LED developers and users, such as optimizing system design, shortening qualification test times, enabling condition-based maintenance for LED-based systems, and providing information for return-on-investment analysis. This paper provides an overview of the prognostic methods and models that have been applied to both LED devices and LED systems, especially for use in long-term operational conditions. These methods include statistical regression, static Bayesian network, Kalman filtering, particle filtering, artificial neural network, and physics-based methods. The general concepts and main features of these methods, the advantages and disadvantages of applying these methods, as well as LED application case studies, are discussed. The fundamental issues of prognostics and photoelectrothermal theory for LED systems are also discussed for clear understanding of the reliability and lifetime concepts for LEDs. Finally, the challenges and opportunities in developing effective prognostic techniques are addressed. | - |
| dcterms.accessRights | open access | en_US |
| dcterms.bibliographicCitation | IEEE transactions on power electronics, Aug. 2017, v. 32, no. 8, p. 6338-6362 | en_US |
| dcterms.isPartOf | IEEE transactions on power electronics | en_US |
| dcterms.issued | 2017-08 | - |
| dc.identifier.scopus | 2-s2.0-85017588087 | - |
| dc.identifier.eissn | 1941-0107 | en_US |
| dc.description.validate | 202402 bcch | - |
| dc.description.oa | Accepted Manuscript | en_US |
| dc.identifier.FolderNumber | ISE-0788 | - |
| dc.description.fundingSource | Others | en_US |
| dc.description.fundingText | National Natural Science Foundation of China; National High Technology Research and Development Program of China; Natural Science Foundation of Jiangsu Province; Changzhou Sci & Tech Program; Fundamental Research Project funded by the Ministry of Industry and Information Technology of PRC; The Hong Kong Polytechnic University | en_US |
| dc.description.pubStatus | Published | en_US |
| dc.identifier.OPUS | 6979347 | - |
| dc.description.oaCategory | Green (AAM) | en_US |
| Appears in Collections: | Journal/Magazine Article | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Yung_Review_Prognostic_Techniques.pdf | Pre-Published version | 1.74 MB | Adobe PDF | View/Open |
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