Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4340
PIRA download icon_1.1View/Download Full Text
Title: Image-based evaluation of seam puckering appearance
Authors: Xin, B
Baciu, G 
Hu, J 
Issue Date: Oct-2008
Source: Journal of electronic imaging, Oct.-Dec. 2008, v. 17, no. 4, 043025, p. 1-12
Abstract: We present the development of an objective evaluation method based on the integration of X-illumination, morphological fractal analysis and Bayes classifier that aims at characterizing the seam-puckering appearance. The experimental results in our research demonstrate that a highly significant correlation coefficient can be achieved between the estimated grades and the technician-generated grades; the presented method is insensitive to the color/ texture of fabrics, thus showing the potential use of our newly developed method to evaluate the seam-puckering appearance objectively and quantitatively.
Keywords: Bayes methods
Correlation methods
Fabrics
Fractals
Image classification
Image colour analysis
Image texture
Lighting
Mathematical morphology
Textile industry
Publisher: SPIE-International Society for Optical Engineering
Journal: Journal of electronic imaging 
ISSN: 1017-9909
EISSN: 1560-229X
DOI: 10.1117/1.3041171
Rights: Copyright 2008 Society of Photo-Optical Instrumentation Engineers and IS&T. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Appears in Collections:Journal/Magazine Article

Files in This Item:
File Description SizeFormat 
Xin_Image-based_evaluation.pdf1.2 MBAdobe PDFView/Open
Open Access Information
Status open access
File Version Version of Record
Access
View full-text via PolyU eLinks SFX Query
Show full item record

Page views

94
Last Week
0
Last month
Citations as of May 22, 2022

Downloads

259
Citations as of May 22, 2022

SCOPUSTM   
Citations

4
Last Week
0
Last month
0
Citations as of May 20, 2022

WEB OF SCIENCETM
Citations

5
Last Week
0
Last month
0
Citations as of May 19, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.