Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4340
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dc.contributorInstitute of Textiles and Clothing-
dc.contributorDepartment of Computing-
dc.creatorXin, B-
dc.creatorBaciu, G-
dc.creatorHu, J-
dc.date.accessioned2014-12-11T08:27:25Z-
dc.date.available2014-12-11T08:27:25Z-
dc.identifier.issn1017-9909-
dc.identifier.urihttp://hdl.handle.net/10397/4340-
dc.language.isoenen_US
dc.publisherSPIE-International Society for Optical Engineeringen_US
dc.rightsCopyright 2008 Society of Photo-Optical Instrumentation Engineers and IS&T. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.en_US
dc.subjectBayes methodsen_US
dc.subjectCorrelation methodsen_US
dc.subjectFabricsen_US
dc.subjectFractalsen_US
dc.subjectImage classificationen_US
dc.subjectImage colour analysisen_US
dc.subjectImage textureen_US
dc.subjectLightingen_US
dc.subjectMathematical morphologyen_US
dc.subjectTextile industryen_US
dc.titleImage-based evaluation of seam puckering appearanceen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1-
dc.identifier.epage12-
dc.identifier.volume17-
dc.identifier.issue4-
dc.identifier.doi10.1117/1.3041171-
dcterms.abstractWe present the development of an objective evaluation method based on the integration of X-illumination, morphological fractal analysis and Bayes classifier that aims at characterizing the seam-puckering appearance. The experimental results in our research demonstrate that a highly significant correlation coefficient can be achieved between the estimated grades and the technician-generated grades; the presented method is insensitive to the color/ texture of fabrics, thus showing the potential use of our newly developed method to evaluate the seam-puckering appearance objectively and quantitatively.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of electronic imaging, Oct.-Dec. 2008, v. 17, no. 4, 043025, p. 1-12-
dcterms.isPartOfJournal of electronic imaging-
dcterms.issued2008-10-
dc.identifier.isiWOS:000263247100020-
dc.identifier.scopus2-s2.0-70350655679-
dc.identifier.eissn1560-229X-
dc.identifier.rosgroupidr42657-
dc.description.ros2008-2009 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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