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Title: | Thickness-dependent structural and electromechanical properties of (Na0.85K0.15)0.5Bi0.5TiO3 multilayer thin film-based heterostructures | Authors: | Wu, Y Or, SW |
Issue Date: | 5-Jul-2018 | Source: | Materials and design, 5 July 2018, v. 149, p. 153-164 | Abstract: | (Na0.85K0.15)0.5Bi0.5TiO3 (NKBT) multilayer thin films with different thicknesses of 100–700 nm, corresponding to 2–14 layers with each layer of ~50 nm thickness, are synthesized on Pt(111)/Ti/SiO2/Si substrates to form Pt/NKBT/Pt/Ti/SiO2/Si heterostructures using different spin-coating and annealing conditions in a modified aqueous sol-gel process. The multilayer thin films spin-coated by two steps (step 1/2) at 600/4000 rpm for 6/30 s and annealed at 700 °C for 5 min with a heating rate of 30 °C/s show a dense, uniform, and continuous morphology as well as a pure perovskite structure with a rhombohedral–tetragonal phase transition at ~140 °C and no preferential orientation in the heterostructures. Their structural and electromechanical properties exhibit consistent improvement trends with increasing thickness from 100 to 550 nm (i.e., 2–11 layers). The 550 nm-thick, 11-layer films demonstrate the best ferroelectric, dielectric, piezoelectric, and electric performance in terms of the highest remnant polarization, saturation polarization, dielectric constant, and effective piezoelectric constant of 18.3 μC/cm2, 53.6 μC/cm2, 463, and 64 pm/V, as well as the lowest coercive field, dielectric loss tangent, and leakage current density of 116 kV/cm, 0.057, and 27 μA/cm2, respectively. The observed thickness-dependent improvement is explained by an interfacial passive layer effect where the motion of both 180° and non-180° domain walls is enhanced in the thicker multilayer thin films by weakening the influence of domain pinning in the interfacial passive layers between the multilayer thin films and the substrates. | Keywords: | Heterostructures Interfacial passive layer Lead-free piezoelectric Multilayer thin films Thickness-dependent properties |
Publisher: | Elsevier | Journal: | Materials and design | ISSN: | 0264-1275 | EISSN: | 1873-4197 | DOI: | 10.1016/j.matdes.2018.04.012 | Rights: | © 2018 Elsevier Ltd. All rights reserved. © 2018. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/. The following publication Wu, Y., & Or, S. W. (2018). Thickness-dependent structural and electromechanical properties of (Na0. 85K0. 15) 0.5 Bi0. 5TiO3 multilayer thin film-based heterostructures. Materials & Design, 149, 153-164 is available at https://doi.org/10.1016/j.matdes.2018.04.012. |
Appears in Collections: | Journal/Magazine Article |
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