Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/93966
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Electrical Engineering | en_US |
dc.creator | Wu, Y | en_US |
dc.creator | Or, SW | en_US |
dc.date.accessioned | 2022-08-03T08:49:34Z | - |
dc.date.available | 2022-08-03T08:49:34Z | - |
dc.identifier.issn | 0264-1275 | en_US |
dc.identifier.uri | http://hdl.handle.net/10397/93966 | - |
dc.language.iso | en | en_US |
dc.publisher | Elsevier | en_US |
dc.rights | © 2018 Elsevier Ltd. All rights reserved. | en_US |
dc.rights | © 2018. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/. | en_US |
dc.rights | The following publication Wu, Y., & Or, S. W. (2018). Thickness-dependent structural and electromechanical properties of (Na0. 85K0. 15) 0.5 Bi0. 5TiO3 multilayer thin film-based heterostructures. Materials & Design, 149, 153-164 is available at https://doi.org/10.1016/j.matdes.2018.04.012. | en_US |
dc.subject | Heterostructures | en_US |
dc.subject | Interfacial passive layer | en_US |
dc.subject | Lead-free piezoelectric | en_US |
dc.subject | Multilayer thin films | en_US |
dc.subject | Thickness-dependent properties | en_US |
dc.title | Thickness-dependent structural and electromechanical properties of (Na0.85K0.15)0.5Bi0.5TiO3 multilayer thin film-based heterostructures | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.identifier.spage | 153 | en_US |
dc.identifier.epage | 164 | en_US |
dc.identifier.volume | 149 | en_US |
dc.identifier.doi | 10.1016/j.matdes.2018.04.012 | en_US |
dcterms.abstract | (Na0.85K0.15)0.5Bi0.5TiO3 (NKBT) multilayer thin films with different thicknesses of 100–700 nm, corresponding to 2–14 layers with each layer of ~50 nm thickness, are synthesized on Pt(111)/Ti/SiO2/Si substrates to form Pt/NKBT/Pt/Ti/SiO2/Si heterostructures using different spin-coating and annealing conditions in a modified aqueous sol-gel process. The multilayer thin films spin-coated by two steps (step 1/2) at 600/4000 rpm for 6/30 s and annealed at 700 °C for 5 min with a heating rate of 30 °C/s show a dense, uniform, and continuous morphology as well as a pure perovskite structure with a rhombohedral–tetragonal phase transition at ~140 °C and no preferential orientation in the heterostructures. Their structural and electromechanical properties exhibit consistent improvement trends with increasing thickness from 100 to 550 nm (i.e., 2–11 layers). The 550 nm-thick, 11-layer films demonstrate the best ferroelectric, dielectric, piezoelectric, and electric performance in terms of the highest remnant polarization, saturation polarization, dielectric constant, and effective piezoelectric constant of 18.3 μC/cm2, 53.6 μC/cm2, 463, and 64 pm/V, as well as the lowest coercive field, dielectric loss tangent, and leakage current density of 116 kV/cm, 0.057, and 27 μA/cm2, respectively. The observed thickness-dependent improvement is explained by an interfacial passive layer effect where the motion of both 180° and non-180° domain walls is enhanced in the thicker multilayer thin films by weakening the influence of domain pinning in the interfacial passive layers between the multilayer thin films and the substrates. | en_US |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Materials and design, 5 July 2018, v. 149, p. 153-164 | en_US |
dcterms.isPartOf | Materials and design | en_US |
dcterms.issued | 2018-07-05 | - |
dc.identifier.scopus | 2-s2.0-85045553295 | - |
dc.identifier.eissn | 1873-4197 | en_US |
dc.description.validate | 202205 bchy | en_US |
dc.description.oa | Accepted Manuscript | en_US |
dc.identifier.FolderNumber | EE-0347 | - |
dc.description.fundingSource | RGC | en_US |
dc.description.fundingText | Innovation and Technology Commission of the HKSAR Goverment to the Hong Kong Branch of National Rail Transit Electrification and Automation Engineering Technology Research Center; National Natural Science Foundation of China | en_US |
dc.description.pubStatus | Published | en_US |
dc.identifier.OPUS | 6835113 | - |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
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Wu_Thickness-Dependent_Structural_Electromechanical.pdf | Pre-Published version | 2.45 MB | Adobe PDF | View/Open |
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