Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/78545
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dc.contributorDepartment of Electronic and Information Engineeringen_US
dc.creatorYang, ZJen_US
dc.creatorFang, Yen_US
dc.creatorHan, GJen_US
dc.creatorCai, GFen_US
dc.creatorLau, FCMen_US
dc.date.accessioned2018-09-28T01:16:52Z-
dc.date.available2018-09-28T01:16:52Z-
dc.identifier.issn2169-3536en_US
dc.identifier.urihttp://hdl.handle.net/10397/78545-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rights© 2018 IEEE. Translations and content mining are permitted for academic research only.en_US
dc.rightsPersonal use is also permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information.en_US
dc.rightsPosted with permission of publisher.en_US
dc.rightsThe following publication Z. Yang, Y. Fang, G. Han, G. Cai and F. C. M. Lau, "Design and Analysis of Punctured Terminated Spatially Coupled Protograph LDPC Codes With Small Coupling Lengths," in IEEE Access, vol. 6, pp. 36723-36731, 2018 is available at https://dx.doi.org/10.1109/ACCESS.2018.2850925en_US
dc.subjectSpatially coupled protograph (SC-P) codesen_US
dc.subjectPunctured codesen_US
dc.subjectDecoding thresholdsen_US
dc.subjectMinimum distanceen_US
dc.subjectCoupling lengthen_US
dc.titleDesign and analysis of punctured terminated spatially coupled protograph LDPC codes with small coupling lengthsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage36723en_US
dc.identifier.epage36731en_US
dc.identifier.volume6en_US
dc.identifier.doi10.1109/ACCESS.2018.2850925en_US
dcterms.abstractSpatially coupled protograph (SC-P) low-density parity-check codes can achieve excellent performance and simple implementation when the coupling length is sufficiently large. However, in the case of small coupling lengths, terminated SC-P (TE-SC-P) codes suffer from relatively weaker decoding thresholds and lower code rates compared with the original protograph codes. To address the above issues, we propose a novel design method to enhance the performance of such TE-SC-P codes. Specifically, we develop a bus-topology-like puncturing rule so as to formulate a new family of SC-P codes, referred to as punctured TE-SC-P (P-TE-SC-P) codes. Theoretical analyses and simulation results show that the proposed P-TE-SC-P codes possess significant performance gains over conventional SC-P codes and randomly punctured TE-SC-P (called RP-TE-SC-P) codes with relatively higher computational complexity.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationIEEE access, 2018, v. 6, p. 36723-36731en_US
dcterms.isPartOfIEEE accessen_US
dcterms.issued2018-
dc.identifier.isiWOS:000439698700020-
dc.description.validate201809 bcrcen_US
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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