Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/74965
Title: Enhanced thermoelectric properties of SnSe thin films grown by pulsed laser glancing-angle deposition
Authors: Suen, CH 
Shi, D 
Su, Y
Zhang, Z 
Chan, CH 
Tang, X
Li, Y
Lam, KH 
Chen, X 
Huang, BL
Zhou, XY
Dai, JY 
Keywords: Glancing angle
Potential barrier scattering
SnSe
Thermoelectric
Issue Date: 2017
Publisher: Chinese Ceramic Society
Source: Journal of materiomics, 2017, v. 3, no. 4, p. 293-298 How to cite?
Journal: Journal of materiomics 
Abstract: SnSe single crystals have been demonstrated to possess excellent thermoelectric properties. In this work, we demonstrate a grain size control method in growing nanocrystalline SnSe thin films through a glancing angle pulsed-laser deposition approach. Structural characterization reveals that the SnSe film deposited at a normal angle has a preferred orientation along a axis, while by contrast, the SnSe film deposited at an 80° glancing angle develops a nanopillar structure with the growth direction towards the incident atomic flux. The glancing angle deposition greatly reduces the grain size of the thin film due to a shadowing effect to the adatoms, resulting in significantly increased power factor for more than 100%. The maximum Seebeck coefficient and power factor are 498.5μV/K and 18.5μWcm−1K−2, respectively. The enhancement of thermoelectric property can be attributed to the potential barrier scattering at grain boundaries owing to the reduced grain size and increased grain boundaries in the film. Given this enhanced power factor, and considering the fact that the nanopillar structure should have much lower thermal conductivity than a plain film, the zT value of such made SnSe film could be significantly larger than the corresponding single crystal film, making it a good candidate for thin film-based thermoelectric device.
URI: http://hdl.handle.net/10397/74965
ISSN: 2352-8478
DOI: 10.1016/j.jmat.2017.05.001
Appears in Collections:Journal/Magazine Article

Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

5
Last Week
0
Last month
Citations as of Oct 4, 2018

WEB OF SCIENCETM
Citations

6
Last Week
0
Last month
Citations as of Oct 12, 2018

Page view(s)

13
Last Week
1
Last month
Citations as of Oct 14, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.