Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/60931
Title: Sub-100 nm resolution microscopy based on proximity projection grating scheme
Authors: Hu, F
Somekh, MG 
Albutt, DJ
Webb, K
Moradi, E
See, CW
Issue Date: 2015
Source: Scientific reports, 26 2015, v. 5, no. , p. 1-8
Abstract: Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.
Publisher: Nature Publishing Group
Journal: Scientific reports 
EISSN: 2045-2322
DOI: 10.1038/srep08589
Rights: This work is licensed under a Creative Commons Attribution 4.0 International License.The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commonsl icense, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
The following publication Hu, F., Somekh, M., Albutt, D. et al. Sub-100 nm resolution microscopy based on proximity projection grating scheme. Sci Rep 5, 8589 (2015) is available at https://dx.doi.org/10.1038/srep08589
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