Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/60931
Title: Sub-100 nm resolution microscopy based on proximity projection grating scheme
Authors: Hu, F
Somekh, MG 
Albutt, DJ
Webb, K
Moradi, E
See, CW
Issue Date: 2015
Publisher: Nature Publishing Group
Source: Scientific reports, 2015, v. 5 How to cite?
Journal: Scientific reports 
Abstract: Structured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.
URI: http://hdl.handle.net/10397/60931
EISSN: 2045-2322
DOI: 10.1038/srep08589
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