Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/60931
PIRA download icon_1.1View/Download Full Text
DC FieldValueLanguage
dc.contributorDepartment of Electronic and Information Engineering-
dc.creatorHu, F-
dc.creatorSomekh, MG-
dc.creatorAlbutt, DJ-
dc.creatorWebb, K-
dc.creatorMoradi, E-
dc.creatorSee, CW-
dc.date.accessioned2016-12-19T08:53:23Z-
dc.date.available2016-12-19T08:53:23Z-
dc.identifier.urihttp://hdl.handle.net/10397/60931-
dc.language.isoenen_US
dc.publisherNature Publishing Groupen_US
dc.rightsThis work is licensed under a Creative Commons Attribution 4.0 International License.The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commonsl icense, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/en_US
dc.rightsThe following publication Hu, F., Somekh, M., Albutt, D. et al. Sub-100 nm resolution microscopy based on proximity projection grating scheme. Sci Rep 5, 8589 (2015) is available at https://dx.doi.org/10.1038/srep08589en_US
dc.titleSub-100 nm resolution microscopy based on proximity projection grating schemeen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume5-
dc.identifier.doi10.1038/srep08589-
dcterms.abstractStructured illumination microscopy (SIM) has been widely used in life science imaging applications. The maximum resolution improvement of SIM, compared to conventional bright field system is a factor of 2. Here we present an approach to structured illumination microscopy using the proximity projection grating scheme (PPGS), which has the ability to further enhance the SIM resolution without invoking any nonlinearity response from the sample. With the PPGS-based SIM, sub-100 nm resolution has been obtained experimentally, and results corresponding to 2.4 times resolution improvement are presented. Furthermore, it will be shown that an improvement of greater than 3 times can be achieved.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationScientific reports, 26 2015, v. 5, no. , p. 1-8-
dcterms.isPartOfScientific reports-
dcterms.issued2015-
dc.identifier.pmid25715953-
dc.identifier.eissn2045-2322-
dc.identifier.rosgroupid2014001991-
dc.description.ros2014-2015 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
Appears in Collections:Journal/Magazine Article
Files in This Item:
File Description SizeFormat 
Hu_Sub-100nm_Resolution_Microscopy.pdf2.03 MBAdobe PDFView/Open
Open Access Information
Status open access
File Version Version of Record
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

Page views

124
Last Week
1
Last month
Citations as of Mar 24, 2024

Downloads

57
Citations as of Mar 24, 2024

SCOPUSTM   
Citations

10
Last Week
0
Last month
Citations as of Mar 28, 2024

WEB OF SCIENCETM
Citations

9
Last Week
0
Last month
Citations as of Mar 28, 2024

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.