Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/463
Title: Microstructure of compositionally-graded (Ba[sub 1-x]Sr[sub x])TiO₃ thin films epitaxially grown on La[sub 0.5]Sr[sub 0.5]CoO₃-covered (100) LaAlO₃ substrates by pulsed laser deposition
Authors: Zhu, X 
Chan, HLW 
Choy, CL
Wong, KH
Hesse, D
Keywords: Barium compounds
Strontium compounds
Dielectric thin films
Epitaxial layers
Microwave materials
Pulsed laser deposition
X-ray diffraction
Electron diffraction
Transmission electron microscopy
Grain size
Voids (solid)
Permittivity
Issue Date: 14-Apr-2005
Publisher: American Institute of Physics
Source: Journal of applied physics, 14 Apr. 2005, v. 97, 093503, p. 1-5 How to cite?
Journal: Journal of applied physics 
Abstract: Compositionally-graded (Ba[sub 1−x]Sr[sub x]dTiO₃ (BST) epitaxial thin films (with x decreasing from 0.25 to 0.0) were deposited by pulsed laser deposition on (100)LaAlO₃ (LAO) single-crystal substrates covered with a conductive La[sub 0.5]Sr[sub 0.5]CoO₃ (LSCO) layer as a bottom electrode. X-ray and electron diffraction patterns demonstrate that the entire graded film has a single-crystal cubic structure. The epitaxial relationship between BST, LSCO, and LAO can be described as (100)[sub BST]
(100)[sub LSCO]
(100)[sub LAO]; [001][sub BST]
[001][sub LSCO]
[001][sub LAO]. Cross-sectional transmission electron microscopy (TEM) images reveal that both the BST films and the LSCO bottom electrodes have sharp interfaces and overall uniform thickness across the entire specimen, and that they grow with a columnar structure. Planar TEM images show that the graded films exhibit granular and/or polyhedral morphologies with an average grain size of 50 nm. High-resolution TEM images reveal aligned rectangular-shaped voids in the graded BST film, with length size of 12-17 nm, and width of 5-8 nm along the <001> direction in the (100) plane.
URI: http://hdl.handle.net/10397/463
ISSN: 0021-8979
Rights: © 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X. Zhu et al. J. Appl. Phys. 97, 093503 (2005) and may be found at http://link.aip.org/link/?jap/97/093503
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