Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/463
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorZhu, X-
dc.creatorChan, HLW-
dc.creatorChoy, CL-
dc.creatorWong, KH-
dc.creatorHesse, D-
dc.date.accessioned2014-12-11T08:27:48Z-
dc.date.available2014-12-11T08:27:48Z-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10397/463-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X. Zhu et al. J. Appl. Phys. 97, 093503 (2005) and may be found at http://link.aip.org/link/?jap/97/093503en_US
dc.subjectBarium compoundsen_US
dc.subjectStrontium compoundsen_US
dc.subjectDielectric thin filmsen_US
dc.subjectEpitaxial layersen_US
dc.subjectMicrowave materialsen_US
dc.subjectPulsed laser depositionen_US
dc.subjectX-ray diffractionen_US
dc.subjectElectron diffractionen_US
dc.subjectTransmission electron microscopyen_US
dc.subjectGrain sizeen_US
dc.subjectVoids (solid)en_US
dc.subjectPermittivityen_US
dc.titleMicrostructure of compositionally-graded (Ba[sub 1-x]Sr[sub x])TiO₃ thin films epitaxially grown on La[sub 0.5]Sr[sub 0.5]CoO₃-covered (100) LaAlO₃ substrates by pulsed laser depositionen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1-
dc.identifier.epage5-
dc.identifier.volume97-
dcterms.abstractCompositionally-graded (Ba[sub 1−x]Sr[sub x]dTiO₃ (BST) epitaxial thin films (with x decreasing from 0.25 to 0.0) were deposited by pulsed laser deposition on (100)LaAlO₃ (LAO) single-crystal substrates covered with a conductive La[sub 0.5]Sr[sub 0.5]CoO₃ (LSCO) layer as a bottom electrode. X-ray and electron diffraction patterns demonstrate that the entire graded film has a single-crystal cubic structure. The epitaxial relationship between BST, LSCO, and LAO can be described as (100)[sub BST]-
dcterms.abstract(100)[sub LSCO]-
dcterms.abstract(100)[sub LAO]; [001][sub BST]-
dcterms.abstract[001][sub LSCO]-
dcterms.abstract[001][sub LAO]. Cross-sectional transmission electron microscopy (TEM) images reveal that both the BST films and the LSCO bottom electrodes have sharp interfaces and overall uniform thickness across the entire specimen, and that they grow with a columnar structure. Planar TEM images show that the graded films exhibit granular and/or polyhedral morphologies with an average grain size of 50 nm. High-resolution TEM images reveal aligned rectangular-shaped voids in the graded BST film, with length size of 12-17 nm, and width of 5-8 nm along the <001> direction in the (100) plane.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 14 Apr. 2005, v. 97, 093503, p. 1-5-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2005-04-14-
dc.identifier.isiWOS:000229155600013-
dc.identifier.scopus2-s2.0-18844424988-
dc.identifier.eissn1089-7550-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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