Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4623
Title: Strain distribution in epitaxial SrTiO₃thin films
Authors: Zhai, ZY
Wu, XS
Jiang, ZS
Hao, JH 
Gao, J
Cai, YF
Pan, YG
Keywords: Strontium compounds
Epitaxial layers
Internal stresses
X-ray diffraction
Lattice constants
Issue Date: 25-Dec-2006
Publisher: American Institute of Physics
Source: Applied physics letters, 25 Dec. 2006, v. 89, no. 26, 262902, p. 1-3 How to cite?
Journal: Applied physics letters 
Abstract: The lattice strain distributions of epitaxial SrTiO₃films deposited on LaAlO₃ were investigated by in situ x-ray diffraction at the temperature range of 25–300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTiO₃was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTiO₃films includes the surface layer, strained layer, and interface layer.
URI: http://hdl.handle.net/10397/4623
ISSN: 0003-6951 (print)
1077-3118 (online)
DOI: 10.1063/1.2424282
Rights: © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Z. Y. Zhai et al., Appl. Phys. Lett. 89, 262902 (2006) and may be found at http://link.aip.org/link/?apl/89/262902
Appears in Collections:Journal/Magazine Article

Files in This Item:
File Description SizeFormat 
Zhai_Strain_Thin_films.pdf75.68 kBAdobe PDFView/Open
Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

15
Last Week
0
Last month
0
Citations as of Jun 4, 2016

WEB OF SCIENCETM
Citations

15
Last Week
0
Last month
0
Citations as of Aug 25, 2016

Page view(s)

252
Last Week
3
Last month
Checked on Aug 21, 2016

Download(s)

456
Checked on Aug 21, 2016

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.