Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/4623
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Department of Applied Physics | - |
| dc.creator | Zhai, ZY | - |
| dc.creator | Wu, XS | - |
| dc.creator | Jiang, ZS | - |
| dc.creator | Hao, JH | - |
| dc.creator | Gao, J | - |
| dc.creator | Cai, YF | - |
| dc.creator | Pan, YG | - |
| dc.date.accessioned | 2014-12-11T08:28:09Z | - |
| dc.date.available | 2014-12-11T08:28:09Z | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.uri | http://hdl.handle.net/10397/4623 | - |
| dc.language.iso | en | en_US |
| dc.publisher | American Institute of Physics | en_US |
| dc.rights | © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Z. Y. Zhai et al., Appl. Phys. Lett. 89, 262902 (2006) and may be found at http://link.aip.org/link/?apl/89/262902 | en_US |
| dc.subject | Strontium compounds | en_US |
| dc.subject | Epitaxial layers | en_US |
| dc.subject | Internal stresses | en_US |
| dc.subject | X-ray diffraction | en_US |
| dc.subject | Lattice constants | en_US |
| dc.title | Strain distribution in epitaxial SrTiO₃thin films | en_US |
| dc.type | Journal/Magazine Article | en_US |
| dc.identifier.spage | 1 | - |
| dc.identifier.epage | 3 | - |
| dc.identifier.volume | 89 | - |
| dc.identifier.issue | 26 | - |
| dc.identifier.doi | 10.1063/1.2424282 | - |
| dcterms.abstract | The lattice strain distributions of epitaxial SrTiO₃films deposited on LaAlO₃ were investigated by in situ x-ray diffraction at the temperature range of 25–300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTiO₃was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTiO₃films includes the surface layer, strained layer, and interface layer. | - |
| dcterms.accessRights | open access | en_US |
| dcterms.bibliographicCitation | Applied physics letters, 25 Dec. 2006, v. 89, no. 26, 262902, p. 1-3 | - |
| dcterms.isPartOf | Applied physics letters | - |
| dcterms.issued | 2006-12-25 | - |
| dc.identifier.isi | WOS:000243157600075 | - |
| dc.identifier.scopus | 2-s2.0-33846044845 | - |
| dc.identifier.eissn | 1077-3118 | - |
| dc.identifier.rosgroupid | r30296 | - |
| dc.description.ros | 2006-2007 > Academic research: refereed > Publication in refereed journal | - |
| dc.description.oa | Version of Record | en_US |
| dc.identifier.FolderNumber | OA_IR/PIRA | en_US |
| dc.description.pubStatus | Published | en_US |
| Appears in Collections: | Journal/Magazine Article | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Zhai_Strain_Thin_films.pdf | 75.68 kB | Adobe PDF | View/Open |
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