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Title: Piezoresponse and ferroelectric properties of lead-free [Bi[sub 0.5](Na[sub 0.7]K[sub 0.2]Li[sub 0.1])[sub 0.5]]TiO₃ thin films by pulsed laser deposition
Authors: Wang, D
Lin, D
Wong, KS
Kwok, KW 
Dai, J 
Chan, HLW 
Keywords: Bismuth compounds
Coercive force
Crystal structure
Dielectric hysteresis
Dielectric polarisation
Electric domains
Ferroelectric ceramics
Ferroelectric thin films
Ferroelectric transitions
Lithium compounds
Piezoelectric thin films
Potassium compounds
Pulsed laser deposition
Sodium compounds
X-ray diffraction
Issue Date: 6-Jun-2008
Publisher: American Institute of Physics
Source: Applied physics letters, 6 June 2008, v. 92, 222909, p. 1-3 How to cite?
Journal: Applied physics letters 
Abstract: Polycrystalline lead-free piezoelectric [Bi[sub 0.5](Na[sub 0.7]K[sub 0.2]Li[sub 0.1])[sub 0.5]]TiO₃ (BNKLT) thin films were grown on Pt/Ti/SiO₂/Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization P[sub r] of 13.9 µC/cm² and a coercive field E[sub c] of 10.2 MV/m. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d[sub 33,f] of the BNKLT thin films was about 64 pm/V.
ISSN: 0003-6951
DOI: 10.1063/1.2938364
Rights: © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in D.Y. Wang et al. Appl. Phys. Lett. 92, 222909 (2008) and may be found at
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