Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/455
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorWang, D-
dc.creatorLin, D-
dc.creatorWong, KS-
dc.creatorKwok, KW-
dc.creatorDai, J-
dc.creatorChan, HLW-
dc.date.accessioned2014-12-11T08:27:47Z-
dc.date.available2014-12-11T08:27:47Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/455-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in D.Y. Wang et al. Appl. Phys. Lett. 92, 222909 (2008) and may be found at http://link.aip.org/link/?apl/92/222909en_US
dc.subjectBismuth compoundsen_US
dc.subjectCoercive forceen_US
dc.subjectCrystal structureen_US
dc.subjectDielectric hysteresisen_US
dc.subjectDielectric polarisationen_US
dc.subjectElectric domainsen_US
dc.subjectFerroelectric ceramicsen_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectFerroelectric transitionsen_US
dc.subjectLithium compoundsen_US
dc.subjectPiezoceramicsen_US
dc.subjectPiezoelectric thin filmsen_US
dc.subjectPotassium compoundsen_US
dc.subjectPulsed laser depositionen_US
dc.subjectSodium compoundsen_US
dc.subjectX-ray diffractionen_US
dc.titlePiezoresponse and ferroelectric properties of lead-free [Bi[sub 0.5](Na[sub 0.7]K[sub 0.2]Li[sub 0.1])[sub 0.5]]TiO₃ thin films by pulsed laser depositionen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1-
dc.identifier.epage3-
dc.identifier.volume92-
dc.identifier.doi10.1063/1.2938364-
dcterms.abstractPolycrystalline lead-free piezoelectric [Bi[sub 0.5](Na[sub 0.7]K[sub 0.2]Li[sub 0.1])[sub 0.5]]TiO₃ (BNKLT) thin films were grown on Pt/Ti/SiO₂/Si substrates using pulsed laser deposition (PLD). In this letter, we report the ferroelectric properties and piezoresponse of the PLD-produced BNKLT thin films. X-ray diffraction characterization revealed a good crystallinity and a pure perovskite structure in the films. The films exhibited a well-defined polarization hysteresis loop with a remnant polarization P[sub r] of 13.9 µC/cm² and a coercive field E[sub c] of 10.2 MV/m. The domain structure and its thermal-driven evolution from the ferroelectric to nonferroelectric phase were observed by piezoresponse force microscopy. The results were consistent with the phase transition profile of BNKLT bulk ceramics. Typical butterfly-shaped piezoresponse loop was obtained and the effective piezoelectric coefficient d[sub 33,f] of the BNKLT thin films was about 64 pm/V.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 6 June 2008, v. 92, 222909, p. 1-3-
dcterms.isPartOfApplied physics letters-
dcterms.issued2008-06-06-
dc.identifier.isiWOS:000256527900066-
dc.identifier.scopus2-s2.0-44849125954-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr36381-
dc.description.ros2007-2008 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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