Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/441
Title: Characterization of proton irradiated copolymer thin films for microelectromechanical system applications
Authors: Lam, TY
Lau, ST
Chao, C
Chan, HLW 
Choy, CL
Cheung, WY
Wong, SP
Keywords: Polymer blends
Polymer films
Proton effects
Light interferometry
Electrostriction
Micromachining
Microactuators
Issue Date: 25-Jan-2007
Publisher: American Institute of Physics
Source: Applied physics letters, 25 Jan. 2007, v. 90, 043511, p. 1-3 How to cite?
Journal: Applied physics letters 
Abstract: The electrostrictive response of proton irradiated poly vinylidene fluoride-trifluoroethylene) [P(VDF-TrFE)] thin films, deposited on silicon (Si) substrates, has been characterized. By applying an ac field to the copolymer films, the induced surface displacement of the film along the thickness direction was measured using a laser interferometer. After the proton irradiation, the electric field induced strain response of the copolymer film is enhanced. Since the copolymer films are laterally clamped by the rigid substrate, the films cannot vibrate freely. At a proton dose of 50 Mrad, the effective electrostrictive coefficient M[sub eff,33] of P(VDF-TrFE) thin film on Si is 0.07 10[sup -18] V²/m² which is ~25 times smaller than that of bulk sample under the same irradiation dose (M[sub 33]=1.76x10[sup −18] V²/m²). Using bulk micromachining to etch away most of the Si substrate, an actuator in the form of a suspended membrane was fabricated. The effective electrostrictive coefficient at the center of the membrane M[sub eff,33] increased to 0.67x10[sup −18] V²/m² due to the weakening of the substrate clamping effect. The resonance characteristics of the actuators based on these irradiated copolymer films were studied.
URI: http://hdl.handle.net/10397/441
ISSN: 0003-6951
Rights: © 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in T.Y. Lam et al. Appl. Phys. Lett. 90, 043511 (2007) and may be found at http://link.aip.org/link/?apl/90/043511
Appears in Collections:Journal/Magazine Article

Files in This Item:
File Description SizeFormat 
microelectromechanical_07.pdf177.38 kBAdobe PDFView/Open
Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

3
Last Week
0
Last month
0
Citations as of Apr 10, 2016

WEB OF SCIENCETM
Citations

2
Last Week
0
Last month
0
Citations as of Sep 26, 2016

Page view(s)

1,309
Last Week
0
Last month
Checked on Sep 25, 2016

Download(s)

391
Checked on Sep 25, 2016

Google ScholarTM

Check



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.