Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/43699
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Land Surveying and Geo-Informatics | en_US |
dc.creator | Wang, Q | en_US |
dc.creator | Shi, W | en_US |
dc.creator | Atkinson, PM | en_US |
dc.date.accessioned | 2016-06-07T06:23:00Z | - |
dc.date.available | 2016-06-07T06:23:00Z | - |
dc.identifier.issn | 0924-2716 | en_US |
dc.identifier.uri | http://hdl.handle.net/10397/43699 | - |
dc.language.iso | en | en_US |
dc.publisher | Elsevier | en_US |
dc.rights | © 2016 International Society for Photogrammetry and Remote Sensing, Inc. (ISPRS). Published by Elsevier B.V. All rights reserved. | en_US |
dc.rights | © 2016. This manuscript version is made available under the CC-BY-NC-ND 4.0 license https://creativecommons.org/licenses/by-nc-nd/4.0/ | en_US |
dc.rights | The following publication Wang, Q., Shi, W., & Atkinson, P. M. (2016). Area-to-point regression kriging for pan-sharpening. ISPRS journal of photogrammetry and remote sensing, 114, 151-165 is available at https://doi.org/10.1016/j.isprsjprs.2016.02.006 | en_US |
dc.subject | Area-to-point regression kriging (ATPRK) | en_US |
dc.subject | Downscaling | en_US |
dc.subject | Geostatistics | en_US |
dc.subject | Pan-sharpening | en_US |
dc.title | Area-to-point regression kriging for pan-sharpening | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.identifier.spage | 151 | en_US |
dc.identifier.epage | 165 | en_US |
dc.identifier.volume | 114 | en_US |
dc.identifier.doi | 10.1016/j.isprsjprs.2016.02.006 | en_US |
dcterms.abstract | Pan-sharpening is a technique to combine the fine spatial resolution panchromatic (PAN) band with the coarse spatial resolution multispectral bands of the same satellite to create a fine spatial resolution multispectral image. In this paper, area-to-point regression kriging (ATPRK) is proposed for pan-sharpening. ATPRK considers the PAN band as the covariate. Moreover, ATPRK is extended with a local approach, called adaptive ATPRK (AATPRK), which fits a regression model using a local, non-stationary scheme such that the regression coefficients change across the image. The two geostatistical approaches, ATPRK and AATPRK, were compared to the 13 state-of-the-art pan-sharpening approaches summarized in Vivone et al. (2015) in experiments on three separate datasets. ATPRK and AATPRK produced more accurate pan-sharpened images than the 13 benchmark algorithms in all three experiments. Unlike the benchmark algorithms, the two geostatistical solutions precisely preserved the spectral properties of the original coarse data. Furthermore, ATPRK can be enhanced by a local scheme in AATRPK, in cases where the residuals from a global regression model are such that their spatial character varies locally. | en_US |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | ISPRS journal of photogrammetry and remote sensing, Apr. 2016, v. 114, p. 151-165 | en_US |
dcterms.isPartOf | ISPRS journal of photogrammetry and remote sensing | en_US |
dcterms.issued | 2016-04 | - |
dc.identifier.scopus | 2-s2.0-84958974360 | - |
dc.description.oa | Accepted Manuscript | en_US |
dc.identifier.FolderNumber | LSGI-0450 | - |
dc.description.fundingSource | RGC | en_US |
dc.description.fundingSource | Others | en_US |
dc.description.fundingText | Hong Kong Polytechnic University; National Natural Science Foundation of China under; National Administration of Surveying; Ministry of Science and Technology of China | en_US |
dc.description.pubStatus | Published | en_US |
dc.identifier.OPUS | 6619004 | - |
Appears in Collections: | Journal/Magazine Article |
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File | Description | Size | Format | |
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Area-to-point regression.pdf | Pre-Published version | 2.94 MB | Adobe PDF | View/Open |
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