Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/396
Title: Substrate-induced strain effect in La[sub 0.875]Ba[sub 0.125]MnO₃ thin films grown on ferroelectric single-crystal substrates
Authors: Zheng, RK
Wang, Y 
Chan, HLW 
Choy, CL 
Luo, H
Issue Date: 28-Feb-2008
Source: Applied physics letters, 28 Feb. 2008, v. 92, 082908, p. 1-3
Abstract: The authors have studied the substrate-induced strain effect in La[sub 0.875]Ba[sub 0.125]MnO₃ (LBMO) thin films grown on ferroelectric 0.67Pb(Mg[sub ⅓]Nb[sub ⅔]) O₃-0.33PbTiO₃ (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed.
Keywords: Barium compounds
Dielectric polarisation
Lanthanum compounds
Piezoelectricity
Stress effects
Thin films
X-ray diffraction
Publisher: American Institute of Physics
Journal: Applied physics letters 
ISSN: 0003-6951
EISSN: 1077-3118
Rights: © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in R.K. Zheng et al. Appl. Phys. Lett. 92, 082908 (2008) and may be found at http://link.aip.org/link/?apl/92/082908
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