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http://hdl.handle.net/10397/396
Title: | Substrate-induced strain effect in La[sub 0.875]Ba[sub 0.125]MnO₃ thin films grown on ferroelectric single-crystal substrates | Authors: | Zheng, RK Wang, Y Chan, HLW Choy, CL Luo, H |
Issue Date: | 28-Feb-2008 | Source: | Applied physics letters, 28 Feb. 2008, v. 92, 082908, p. 1-3 | Abstract: | The authors have studied the substrate-induced strain effect in La[sub 0.875]Ba[sub 0.125]MnO₃ (LBMO) thin films grown on ferroelectric 0.67Pb(Mg[sub ⅓]Nb[sub ⅔]) O₃-0.33PbTiO₃ (PMN-PT) single-crystal substrates. Both the strain and resistance of the films can be in situ varied by applying an electric field across the PMN-PT substrates. X-ray diffraction analysis indicates that the variations of strain and resistance result from the induced strain in the PMN-PT substrate due to the ferroelectric polarization or the converse piezoelectric effect. The relationships between the resistance and the induced strain in the LBMO film and PMN-PT substrate have been quantitatively analyzed. | Keywords: | Barium compounds Dielectric polarisation Lanthanum compounds Piezoelectricity Stress effects Thin films X-ray diffraction |
Publisher: | American Institute of Physics | Journal: | Applied physics letters | ISSN: | 0003-6951 | EISSN: | 1077-3118 | Rights: | © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in R.K. Zheng et al. Appl. Phys. Lett. 92, 082908 (2008) and may be found at http://link.aip.org/link/?apl/92/082908 |
Appears in Collections: | Journal/Magazine Article |
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