Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/391
Title: Microstructure and enhanced in-plane ferroelectricity of Ba[sub 0.7]Sr[sub 0.3]TiO₃ thin films grown on MgAl₂O₄ (001) single-crystal substrate
Authors: Zhou, X
Heindl, T
Pang, GKH
Miao, J
Zheng, RK
Chan, HLW 
Choy, CL
Wang, Y 
Keywords: Barium compounds
Strontium compounds
Ferroelectric thin films
Epitaxial layers
Pulsed laser deposition
X-ray diffraction
Transmission electron microscopy
Dielectric polarisation
Crystal microstructure
Ferroelectric Curie temperature
Issue Date: 7-Dec-2006
Publisher: American Institute of Physics
Source: Applied physics letters, 7 Dec. 2006, v. 89, 232906, p. 1-3 How to cite?
Journal: Applied physics letters 
Abstract: The microstructure and in-plane dielectric and ferroelectric properties of highly oriented Ba[sub 0.7]Sr[sub 0.3]TiO₃(BST) thin film grown on MgAl₂O₄ (001) single-crystal substrate through pulsed laser deposition were investigated. X-ray diffraction measurements indicated that BST had a distorted lattice with a tetragonality a/c=1.012. The cross- sectional observation under transmission electron microscope revealed that, while most of BST grains grew epitaxially on MgAl₂O₄, the film also contained a noticeable amount of misoriented grains and dislocations. The electrical measurements indicated that the film had a shifted Curie temperature (T[sub C]=78 °C) and an enhanced in-plane ferroelectricity (remnant polarization P[sub r]=7.1 µC/cm²) when compared with BST ceramic (T[sub C]≈33°C and P[sub r]≈0).
URI: http://hdl.handle.net/10397/391
ISSN: 0003-6951
DOI: 10.1063/1.2402900
Rights: © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X.Y. Zhou et al. Appl. Phys. Lett. 89, 232906 (2006) and may be found at http://link.aip.org/link/?apl/89/232906
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