Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/391
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dc.contributorDepartment of Applied Physics-
dc.creatorZhou, X-
dc.creatorHeindl, T-
dc.creatorPang, GKH-
dc.creatorMiao, J-
dc.creatorZheng, RK-
dc.creatorChan, HLW-
dc.creatorChoy, CL-
dc.creatorWang, Y-
dc.date.accessioned2014-12-11T08:27:45Z-
dc.date.available2014-12-11T08:27:45Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/391-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in X.Y. Zhou et al. Appl. Phys. Lett. 89, 232906 (2006) and may be found at http://link.aip.org/link/?apl/89/232906en_US
dc.subjectBarium compoundsen_US
dc.subjectStrontium compoundsen_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectEpitaxial layersen_US
dc.subjectPulsed laser depositionen_US
dc.subjectX-ray diffractionen_US
dc.subjectTransmission electron microscopyen_US
dc.subjectDielectric polarisationen_US
dc.subjectCrystal microstructureen_US
dc.subjectFerroelectric Curie temperatureen_US
dc.titleMicrostructure and enhanced in-plane ferroelectricity of Ba[sub 0.7]Sr[sub 0.3]TiO₃ thin films grown on MgAl₂O₄ (001) single-crystal substrateen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: X. Y. Zhouen_US
dc.description.otherinformationAuthor name used in this publication: J. Miaoen_US
dc.description.otherinformationAuthor name used in this publication: H. L. W. Chanen_US
dc.description.otherinformationAuthor name used in this publication: C. L. Choyen_US
dc.description.otherinformationAuthor name used in this publication: Y. Wangen_US
dc.description.otherinformationAuthor name used in this publication: G. K. H. Pangen_US
dc.identifier.spage1-
dc.identifier.epage3-
dc.identifier.volume89-
dc.identifier.doi10.1063/1.2402900-
dcterms.abstractThe microstructure and in-plane dielectric and ferroelectric properties of highly oriented Ba[sub 0.7]Sr[sub 0.3]TiO₃(BST) thin film grown on MgAl₂O₄ (001) single-crystal substrate through pulsed laser deposition were investigated. X-ray diffraction measurements indicated that BST had a distorted lattice with a tetragonality a/c=1.012. The cross- sectional observation under transmission electron microscope revealed that, while most of BST grains grew epitaxially on MgAl₂O₄, the film also contained a noticeable amount of misoriented grains and dislocations. The electrical measurements indicated that the film had a shifted Curie temperature (T[sub C]=78 °C) and an enhanced in-plane ferroelectricity (remnant polarization P[sub r]=7.1 µC/cm²) when compared with BST ceramic (T[sub C]≈33°C and P[sub r]≈0).-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 7 Dec. 2006, v. 89, 232906, p. 1-3-
dcterms.isPartOfApplied physics letters-
dcterms.issued2006-12-07-
dc.identifier.isiWOS:000242709200086-
dc.identifier.scopus2-s2.0-33845460812-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr30615-
dc.description.ros2006-2007 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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