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Title: All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate
Authors: Chan, LY
Qureshi, KK
Wai, PKA 
Moses, B
Lui, LFK
Tam, HY 
Demokan, S
Keywords: Bit-error monitoring
Injection locking
Optical data processing
Optical logic gate
Issue Date: Apr-2003
Publisher: IEEE
Source: IEEE photonics technology letters, Apr. 2003, v. 15, no. 4, p. 593-595 How to cite?
Journal: IEEE photonics technology letters 
Abstract: A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.
ISSN: 1041-1135
DOI: 10.1109/LPT.2003.809298
Rights: © 2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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