Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/2483
Title: Interfacial defects in resistive switching devices probed by thermal analysis
Authors: Lau, HK
Leung, DCW 
Hu, W
Chan, PKL
Keywords: Aluminium
Calcium compounds
Electrodes
Interface structure
Nickel
Praseodymium compounds
Switches
Thermal analysis
Issue Date: 1-Jul-2009
Publisher: American Institute of Physics
Source: Journal of applied physics, 1 July 2009, v. 106, no. 1, 014504, p. 1-4 How to cite?
Journal: Journal of applied physics 
Abstract: Resistive switching mechanism is investigated by thermal analysis of metal electrodes in the planar Al/Pr₀.₇Ca₀.₃MnO₃(PCMO)/Ni resistive switching device geometry. Two microthermocouples are used to monitor the electrode temperatures under different electrical bias conditions. Comparison of temperature differences between Al and Ni electrodes at high and low resistance states suggests that local heat source exists under the Al electrode at high resistance state. It agrees well with the recent finding in which AlO᙮ presents at the Al/PCMO interface and it can be the origin of the resistance switching mechanism [Li et al., J. Phys. D 42, 045411 (2009)]. Thermal measurements demonstrate excellent capability on characterizing resistance switching devices.
URI: http://hdl.handle.net/10397/2483
ISSN: 0021-8979 (print)
1089-7550 (online)
DOI: 10.1063/1.3157207
Rights: © 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in H.K. Lau al., J. Appl. Phys. 106, 014504 (2009) and may be found at http://link.aip.org/link/?jap/106/014504
Appears in Collections:Journal/Magazine Article

Files in This Item:
File Description SizeFormat 
2145.pdf298.52 kBAdobe PDFView/Open
Access
View full-text via PolyU eLinks SFX Query
Show full item record

SCOPUSTM   
Citations

6
Last Week
0
Last month
0
Citations as of Jun 2, 2016

WEB OF SCIENCETM
Citations

4
Last Week
0
Last month
0
Citations as of Dec 6, 2016

Page view(s)

330
Last Week
1
Last month
Checked on Dec 4, 2016

Download(s)

249
Checked on Dec 4, 2016

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.