Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/87759
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Electronic and Information Engineering | - |
dc.creator | Chow, TWK | - |
dc.creator | Lun, DPK | - |
dc.creator | Pechprasarn, S | - |
dc.creator | Somekh, MG | - |
dc.date.accessioned | 2020-08-19T06:26:47Z | - |
dc.date.available | 2020-08-19T06:26:47Z | - |
dc.identifier.issn | 0957-0233 | - |
dc.identifier.uri | http://hdl.handle.net/10397/87759 | - |
dc.language.iso | en | en_US |
dc.publisher | Institute of Physics Publishing | en_US |
dc.rights | Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 license (https://creativecommons.org/licenses/by/4.0/). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. | en_US |
dc.rights | © 2020 The Author(s). | en_US |
dc.rights | The following publication Terry W K Chow et al 2.2. Meas. Sci. Technol. 31 .754.1 is available at https://dx.doi.org/10.1088/1361-6501/ab7def | en_US |
dc.subject | Surface plasmon | en_US |
dc.subject | Single for m01-06 =m05 shot | en_US |
dc.subject | Image plane | en_US |
dc.title | Defocus leakage radiation microscopy for single for m01-06 =m05 shot surface plasmon measurement | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.identifier.spage | 1 | - |
dc.identifier.epage | 9 | - |
dc.identifier.volume | 31 | - |
dc.identifier.issue | 7 | - |
dc.identifier.doi | 10.1088/1361-6501/ab7def | - |
dcterms.abstract | Measurement of surface plasmon and surface wave propagation is important for the operation and characterization of sensors and microscope systems. One challenge is to perform these measurements both quickly and with good spatial resolution without any modification to the sample surface. This paper addresses these issues by projecting an image of the field excited from a defocused sample to a magnified image plane. By carefully analysing the intensity distribution in this plane the properties of the surface waves generated on the sample surface can be determined. This has the advantage over previous techniques that the data can be obtained in a single for m01-06 =m05 shot without any changes to the focal position of the sample. Equally importantly, we show the method measures the local properties of the sample at well-defined positions, whereas other methods such as direct observation of the back focal plane average the properties over the propagation length of the surface waves. | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Measurement science and technology, July 2020, v. 31, no. 7, 75401, p. 1-9 | - |
dcterms.isPartOf | Measurement science and technology | - |
dcterms.issued | 2020-07 | - |
dc.identifier.isi | WOS:000531332500001 | - |
dc.identifier.scopus | 2-s2.0-85085158487 | - |
dc.identifier.eissn | 1361-6501 | - |
dc.identifier.artn | 75401 | - |
dc.description.validate | 202008 bcrc | - |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | OA_Scopus/WOS | en_US |
dc.description.pubStatus | Published | en_US |
dc.description.oaCategory | CC | en_US |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
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Chow_Defocus_Leakage_Radiation.pdf | 2.69 MB | Adobe PDF | View/Open |
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