Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/8401
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dc.contributorDepartment of Applied Physics-
dc.creatorLin, YB-
dc.creatorYan, ZB-
dc.creatorLu, XB-
dc.creatorLu, ZX-
dc.creatorZeng, M-
dc.creatorChen, Y-
dc.creatorGao, XS-
dc.creatorWan, JG-
dc.creatorDai, JY-
dc.creatorLiu, JM-
dc.date.accessioned2015-05-26T08:17:07Z-
dc.date.available2015-05-26T08:17:07Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/8401-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2014 AIP Publishing LLC.en_US
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Y. B. Lin et al., Appl. Phys. Lett. 104, 143503 (2014) and may be found at https://dx.doi.org/10.1063/1.4870813en_US
dc.titleTemperature-dependent and polarization-tuned resistive switching in Au/BiFeO3/SrRuO3 junctionsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume104-
dc.identifier.issue14-
dc.identifier.doi10.1063/1.4870813-
dcterms.abstractThe relationship between the bipolar resistive switching and the polarization reversal is investigated at various temperatures in the Au/BiFeO3/SrRuO3 structure. It is found that the polarization-induced barrier variation in the Au/BiFeO3 and BiFeO3/SrRuO3 junctions decreases with decreasing temperature. This explains why the resistance-switching ratio decreases with decreasing temperature below 323 K and gives evidence that the polarization modulates the resistance state of the Au/BiFeO3/SrRuO3 structure. Besides, the oxygen vacancies migration and/or the carrier trapping/detrapping mechanisms are also suggested to play a very important role in the resistive switching behavior in this structure as the temperature goes above 323 K.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 2014, v. 104, no. 14, 143503, p. 143503-1-143503-5-
dcterms.isPartOfApplied physics letters-
dcterms.issued2014-
dc.identifier.isiWOS:000334849200073-
dc.identifier.scopus2-s2.0-84898953760-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr70065-
dc.description.ros2013-2014 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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