Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/70856
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dc.contributorDepartment of Applied Physics-
dc.creatorPetti, L-
dc.creatorPattanasattayavong, P-
dc.creatorLin, YH-
dc.creatorMunzenrieder, N-
dc.creatorCantarella, G-
dc.creatorYaacobi-Gross, N-
dc.creatorYan, F-
dc.creatorTroster, G-
dc.creatorAnthopoulos, TD-
dc.date.accessioned2017-12-28T06:18:19Z-
dc.date.available2017-12-28T06:18:19Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/70856-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2017 Author(s).en_US
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in L. Petti et al., Appl. Phys. Lett. 110, 113504 (2017) and may be found at https://dx.doi.org/10.1063/1.4978531en_US
dc.titleSolution-processed p-type copper(I) thiocyanate (CuSCN) for low-voltage flexible thin-film transistors and integrated inverter circuitsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume110-
dc.identifier.issue11-
dc.identifier.doi10.1063/1.4978531-
dcterms.abstractWe report on low operating voltage thin-film transistors (TFTs) and integrated inverters based on copper(I) thiocyanate (CuSCN) layers processed from solution at low temperature on freestanding plastic foils. As-fabricated coplanar bottom-gate and staggered top-gate TFTs exhibit hole-transporting characteristics with average mobility values of 0.0016 cm(2) V-1 s(-1) and 0.013 cm(2) V-1 s(-1), respectively, current on/off ratio in the range 10(2) -10(4), and maximum operating voltages between -3.5 and -10 V, depending on the gate dielectric employed. The promising TFT characteristics enable fabrication of unipolar NOT gates on flexible free-standing plastic substrates with voltage gain of 3.4 at voltages as low as -3.5V. Importantly, discrete CuSCN transistors and integrated logic inverters remain fully functional even when mechanically bent to a tensile radius of 4mm, demonstrating the potential of the technology for flexible electronics. Published by AIP Publishing.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 2017, v. 110, no. 11, 113504, p. 113504-1-113504-5-
dcterms.isPartOfApplied physics letters-
dcterms.issued2017-
dc.identifier.isiWOS:000397871900038-
dc.identifier.ros2016006154-
dc.identifier.eissn1077-3118-
dc.identifier.artn113504-
dc.identifier.rosgroupid2016005894-
dc.description.ros2016-2017 > Academic research: refereed > Publication in refereed journal-
dc.description.validatebcrc-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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