Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/70605
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dc.contributorDepartment of Electronic and Information Engineeringen_US
dc.creatorZhang, Xen_US
dc.creatorZhan, Cen_US
dc.creatorTse, CKen_US
dc.date.accessioned2017-12-28T06:17:29Z-
dc.date.available2017-12-28T06:17:29Z-
dc.identifier.issn2156-3357en_US
dc.identifier.urihttp://hdl.handle.net/10397/70605-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rights© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
dc.rightsThe following publication X. Zhang, C. Zhan and C. K. Tse, "Modeling the Dynamics of Cascading Failures in Power Systems," in IEEE Journal on Emerging and Selected Topics in Circuits and Systems, vol. 7, no. 2, pp. 192-204, June 2017 is available at https://doi.org/10.1109/JETCAS.2017.2671354.en_US
dc.subjectComplex networken_US
dc.subjectPower systemen_US
dc.subjectDynamics of cascading failureen_US
dc.subjectPower flow studyen_US
dc.subjectStochastic processen_US
dc.titleModeling the dynamics of cascading failures in power systemsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage192en_US
dc.identifier.epage204en_US
dc.identifier.volume7en_US
dc.identifier.issue2en_US
dc.identifier.doi10.1109/JETCAS.2017.2671354en_US
dcterms.abstractIn this paper, we use a circuit-based power flow model to study the cascading failure propagation process, and combine it with a stochastic model to describe the uncertain failure time instants, producing a model that gives a complete dynamic profile of the cascading failure propagation beginning from a dysfunctioned component and developing eventually to a large-scale blackout. The sequence of failures is determined by voltage and current stresses of individual elements, which are governed by deterministic circuit equations, while the time durations between failures are described by stochastic processes. The use of stochastic processes here addresses the uncertainties in individual components' physical failure mechanisms, which may depend on manufacturing quality and environmental factors. The element failure rate is related to the extent of overloading. A network-based stochastic model is developed to study the failure propagation dynamics of the entire power network. Simulation results show that our model generates dynamic profiles of cascading failures that contain all salient features displayed in historical blackout data. The proposed model thus offers predictive information about occurrences of large-scale blackouts. We further plot cumulative distribution of the blackout size to assess the overall system's robustness. We show that heavier loads increase the likelihood of large blackouts and that small-world network structure would make cascading failure propagate more widely and rapidly than a regular network structure.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationIEEE journal on emerging and selected topics in circuits and systems, June 2017, v. 7, no. 2, p. 192-204en_US
dcterms.isPartOfIEEE journal on emerging and selected topics in circuits and systemsen_US
dcterms.issued2017-06-
dc.identifier.isiWOS:000403438900003-
dc.identifier.ros2016005624-
dc.identifier.rosgroupid2016005373-
dc.description.ros2016-2017 > Academic research: refereed > Publication in refereed journalen_US
dc.description.validatebcrcen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberRGC-B3-1002-
dc.description.fundingSourceRGCen_US
dc.description.pubStatusPublisheden_US
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