Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/62050
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dc.contributorDepartment of Applied Physics-
dc.creatorYan, ZB-
dc.creatorYau, HM-
dc.creatorLi, ZW-
dc.creatorGao, XS-
dc.creatorDai, JY-
dc.creatorLiu, JM-
dc.date.accessioned2016-12-19T08:58:21Z-
dc.date.available2016-12-19T08:58:21Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/62050-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2016 Author(s).en_US
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Z. B. Yan et al., Appl. Phys. Lett. 109, 053506 (2016) and may be found at https://dx.doi.org/10.1063/1.4960523en_US
dc.titleSelf-electroforming and high-performance complementary memristor based on ferroelectric tunnel junctionsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume109-
dc.identifier.issue5-
dc.identifier.doi10.1063/1.4960523-
dcterms.abstractComplementary resistive switching (CRS) has potential applications in ultra-high density three-dimensional crossbar arrays for resistive random access memories and Logic-in-Memories. For real applications, the good stability and electroforming-free character have become essential pre-requisites. In this work, we investigate the resistance switching behaviors of a CRS device based on two anti-serial Au/BaTiO3/Nb:SrTiO3 ferroelectric tunnel junctions (FTJs). This FTJ-based CRS device shows a stable butterfly-like resistance-voltage hysteresis, as well as self-electroforming, multi-switching, and good performance complementary switching behaviors. The present work presents a convincing demonstration of the complementary multi-switching states modulated by remnant ferroelectric polarization, making the FTJ structure good potentials for high-performance CRS memristors.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 2016, v. 109, no. 5, 53506, p. 053506-1-053506-5-
dcterms.isPartOfApplied physics letters-
dcterms.issued2016-
dc.identifier.isiWOS:000383091400049-
dc.identifier.scopus2-s2.0-84981244747-
dc.identifier.ros2016006140-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupid2016005881-
dc.description.ros2016-2017 > Academic research: refereed > Publication in refereed journal-
dc.description.validate201804_a bcma-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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