Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/598
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorZhou, Q-
dc.creatorChan, HLW-
dc.creatorZhang, Q-
dc.creatorChoy, CL-
dc.date.accessioned2014-12-11T08:24:35Z-
dc.date.available2014-12-11T08:24:35Z-
dc.identifier.isbn0-7803-2695-4-
dc.identifier.urihttp://hdl.handle.net/10397/598-
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.rights© 1996 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.subjectAnnealingen_US
dc.subjectCrystal microstructureen_US
dc.subjectDifferential thermal analysisen_US
dc.subjectFerroelectric materialsen_US
dc.subjectNanostructured materialsen_US
dc.subjectPowdersen_US
dc.subjectScanning electron microscopyen_US
dc.subjectTemperature controlen_US
dc.subjectThermal effectsen_US
dc.subjectThermogravimetric analysisen_US
dc.subjectThin filmsen_US
dc.subjectX-ray diffractionen_US
dc.titleStructure of nanocrystalline powder and thin films of lead lanthanum titanate prepared by the sol-gel processen_US
dc.typeConference Paperen_US
dcterms.abstractUltrafine powder and thin films of lead lanthanum titanate (PLT) were prepared by the sol-gel process. The structural variation of the powder with increasing annealing temperature was monitored by differential thermal analysis, thermogravimetric analysis and x-ray diffraction. The lowest temperature for the formation of nanocrystals in the powder was found to be about 500°C. Crystallites of various sizes were obtained by controlling the annealing temperature and time. Thin films of PLT were fabricated by spin casting the sol-gel solution onto Si(111) substrates and the microstructure was analyzed using a scanning electron microscope. By controlling the concentration of the precursor and the processing temperature, PLT thin films with uniform crystallite size could be prepared.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationISE 9 : 9th International Symposium on Electrets : Shanghai, 25-30 September, 1996 : proceedings, p. 656-661-
dcterms.issued1996-
dc.identifier.isiWOS:A1996BH11M00116-
dc.identifier.scopus2-s2.0-0030382649-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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