Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/571
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorZhu, J-
dc.creatorZhang, XY-
dc.creatorDai, JB-
dc.creatorChan, HLW-
dc.date.accessioned2014-12-11T08:28:08Z-
dc.date.available2014-12-11T08:28:08Z-
dc.identifier.isbn0-7803-7560-2-
dc.identifier.urihttp://hdl.handle.net/10397/571-
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.rights© 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.subjectCrystal structureen_US
dc.subjectCrystalline materialsen_US
dc.subjectDielectric relaxationen_US
dc.subjectElectron trapsen_US
dc.subjectFourier transform infrared spectroscopyen_US
dc.subjectNylon polymersen_US
dc.subjectPhase transitionsen_US
dc.subjectQuenchingen_US
dc.subjectThermal effectsen_US
dc.subjectX ray diffraction analysisen_US
dc.titleInvestigation of the trap states in quenched and annealed nylon 6 films using thermally stimulated depolarization currenten_US
dc.typeConference Paperen_US
dcterms.abstractQuenched and annealed nylon 6 films were prepared and their short-circuit thermally stimulated depolarization current (TSDC) has been measured using a modified thermal electric analyzer. The space charge peak in the temperature range of 90°C∼180°C observed in the TSDC spectra of different samples showed that the trap state of the films shifted to lower temperature as annealing time increased. In general, the trap state became shallower in the annealed sample. The result was consistent with the structural transition of quenched β form to annealed α form. FTIR spectrum and X-ray diffraction were also used to examine the transition. According to the analysis of the phase transition, structural origin of the TSDC peaks has been proposed.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitation11th International Symposium on Electrets (ISE 11) : 1-3 October, 2002, Glen Waverley, Melbourne, Australia : proceedings, p. 126-129-
dcterms.issued2002-
dc.identifier.scopus2-s2.0-0036953869-
dc.identifier.rosgroupidr14486-
dc.description.ros2002-2003 > Academic research: refereed > Refereed conference paper-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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