Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4889
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dc.contributorDepartment of Mechanical Engineering-
dc.creatorWang, B-
dc.creatorWoo, CH-
dc.date.accessioned2014-12-11T08:24:03Z-
dc.date.available2014-12-11T08:24:03Z-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10397/4889-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in B. Wang & C. H. Woo, J. Appl. Phys. 94, 4053 (2003) and may be found at http://link.aip.org/link/?jap/94/4053.en_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectAtomic force microscopyen_US
dc.subjectElectric domainsen_US
dc.subjectGreen's function methodsen_US
dc.subjectElectric fieldsen_US
dc.subjectDielectric depolarisationen_US
dc.titleAtomic force microscopy-induced electric field in ferroelectric thin filmsen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: C. H. Wooen_US
dc.identifier.spage4053-
dc.identifier.epage4059-
dc.identifier.volume94-
dc.identifier.issue6-
dc.identifier.doi10.1063/1.1603345-
dcterms.abstractThe use of atomic force microscopy (AFM) to tailor and image ferroelectric domains in the submicron and nanometer ranges is gaining increasing attention. Many applications have been developed that make use of the superhigh electric field generated by the sharp AFM tip in a local area. In this article, we derive an explicit expression for the AFM-induced electric field in a ferroelectric thin film. Based on a similar approach, we also obtain the depolarization field created by polarization charges using the Green function technique. Based on the expressions derived, the effects of the substrate are discussed.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 15 Sept. 2003, v. 94, no. 6, p. 4053-4059-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2003-09-15-
dc.identifier.isiWOS:000185419600056-
dc.identifier.scopus2-s2.0-0141990523-
dc.identifier.eissn1089-7550-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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