Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4889
PIRA download icon_1.1View/Download Full Text
DC FieldValueLanguage
dc.contributorDepartment of Mechanical Engineering-
dc.creatorWang, B-
dc.creatorWoo, CH-
dc.date.accessioned2014-12-11T08:24:03Z-
dc.date.available2014-12-11T08:24:03Z-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10397/4889-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in B. Wang & C. H. Woo, J. Appl. Phys. 94, 4053 (2003) and may be found at http://link.aip.org/link/?jap/94/4053.en_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectAtomic force microscopyen_US
dc.subjectElectric domainsen_US
dc.subjectGreen's function methodsen_US
dc.subjectElectric fieldsen_US
dc.subjectDielectric depolarisationen_US
dc.titleAtomic force microscopy-induced electric field in ferroelectric thin filmsen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: C. H. Wooen_US
dc.identifier.spage4053-
dc.identifier.epage4059-
dc.identifier.volume94-
dc.identifier.issue6-
dc.identifier.doi10.1063/1.1603345-
dcterms.abstractThe use of atomic force microscopy (AFM) to tailor and image ferroelectric domains in the submicron and nanometer ranges is gaining increasing attention. Many applications have been developed that make use of the superhigh electric field generated by the sharp AFM tip in a local area. In this article, we derive an explicit expression for the AFM-induced electric field in a ferroelectric thin film. Based on a similar approach, we also obtain the depolarization field created by polarization charges using the Green function technique. Based on the expressions derived, the effects of the substrate are discussed.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 15 Sept. 2003, v. 94, no. 6, p. 4053-4059-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2003-09-15-
dc.identifier.isiWOS:000185419600056-
dc.identifier.scopus2-s2.0-0141990523-
dc.identifier.eissn1089-7550-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
Appears in Collections:Journal/Magazine Article
Files in This Item:
File Description SizeFormat 
Wang_Atomic_force_microscopy-induced.pdf987.38 kBAdobe PDFView/Open
Open Access Information
Status open access
File Version Version of Record
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

Page views

165
Last Week
1
Last month
Citations as of Jul 14, 2024

Downloads

280
Citations as of Jul 14, 2024

SCOPUSTM   
Citations

31
Last Week
0
Last month
0
Citations as of Jul 11, 2024

WEB OF SCIENCETM
Citations

31
Last Week
0
Last month
0
Citations as of Jul 11, 2024

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.