Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4781
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dc.contributorDepartment of Applied Physics-
dc.creatorLi, DF-
dc.creatorWang, Y-
dc.creatorDai, J-
dc.date.accessioned2014-12-11T08:28:54Z-
dc.date.available2014-12-11T08:28:54Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/4781-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in D. F. Li, Yan Wang, & J. Y. Dai, Appl. Phys. Lett. 98, 122108 (2011) and may be found at http://link.aip.org/link/?apl/98/122108en_US
dc.subjectCarrier mobilityen_US
dc.subjectDoping profilesen_US
dc.subjectDysprosium compoundsen_US
dc.subjectInsulating thin filmsen_US
dc.subjectInterface phenomenaen_US
dc.subjectInterface statesen_US
dc.subjectMetal-insulator transitionen_US
dc.subjectStrontium compoundsen_US
dc.titleTunable electronic transport properties of DyScO₃/SrTiO₃ polar heterointerfaceen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: J. Y. Daien_US
dc.identifier.spage1-
dc.identifier.epage3-
dc.identifier.volume98-
dc.identifier.doi10.1063/1.3570694-
dcterms.abstractElectronic transport properties of DyScO₃/SrTiO₃ polar heterointerface grown at different oxygen pressures are studied. This DyScO₃/SrTiO₃ polar heterointerface exhibits much higher charge mobility, up to 10⁴ cm² V⁻¹ s⁻¹, compared to the LaAlO₃/SrTiO₃ system due to relatively lower lattice mismatch between the film and substrate. More significantly, the DyScO₃ film deposited under 10⁻⁴ mbar oxygen pressure presents an interfacial metal-to-semiconductor conducting mechanism transition at 90 K. Field effect transport measurement results reveal that this transition can be modulated by field effect through controlling the electron doping level of the interface originated from interfacial electronic reconstruction.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 21 Mar. 2011, v. 98, 122108, p. 1-3-
dcterms.isPartOfApplied physics letters-
dcterms.issued2011-03-21-
dc.identifier.isiWOS:000288808200045-
dc.identifier.scopus2-s2.0-79953866372-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr52213-
dc.description.ros2010-2011 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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