Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4578
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dc.contributorDepartment of Applied Physics-
dc.creatorYao, Y-
dc.creatorLiu, WC-
dc.creatorMak, CL-
dc.creatorWong, KH-
dc.date.accessioned2014-12-11T08:24:03Z-
dc.date.available2014-12-11T08:24:03Z-
dc.identifier.issn2158-3226 (online)-
dc.identifier.urihttp://hdl.handle.net/10397/4578-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rightsCopyright 2011 Author(s). This article is distributed under a Creative Commons Attribution 3.0 Unported License.en_US
dc.subjectBarium compoundsen_US
dc.subjectEnergy gapen_US
dc.subjectEpitaxial layersen_US
dc.subjectGrain sizeen_US
dc.subjectInternal stressesen_US
dc.subjectNeodymiumen_US
dc.subjectPhotoluminescenceen_US
dc.subjectPulsed laser depositionen_US
dc.subjectRaman spectraen_US
dc.subjectStrontium compoundsen_US
dc.subjectX-ray diffractionen_US
dc.titleEffects of stress on the optical properties of epitaxial Nd-doped Sr₀.₅Ba₀.₅Nb₂O₆ filmsen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: Y. B. Yaoen_US
dc.description.otherinformationAuthor name used in this publication: C. L. Maken_US
dc.description.otherinformationAuthor name used in this publication: K. H. Wongen_US
dc.identifier.spage1-
dc.identifier.epage10-
dc.identifier.volume1-
dc.identifier.issue3-
dc.identifier.doi10.1063/1.3647516-
dcterms.abstractNd-doped Sr₀.₅Ba₀.₅Nb₂O₆ (SBN) thin films with thicknesses ranging from 15 nm to 460 nm were grown on MgO (100) substrates using pulsed laser deposition technique. X-ray diffraction studies showed that the films were highly (001)-oriented and epitaxially grown on the substrates. Raman spectroscopy revealed the presence of residual stresses in the films especially for those with thicknesses below 100 nm. Transmittance and photoluminescence spectra revealed that the band-gap energies as well as the light-induced emission bands were shifted to higher energies as the film thickness decreased. The Nd³⁺ emission lines in the films were also dependent on film thickness. Origins of these observations were discussed based upon the stress as well as grain size effects.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationAIP advances, 26 Sept. 2011, v. 1, no. 3, 032172, p. 1-10-
dcterms.isPartOfAIP advances-
dcterms.issued2011-09-26-
dc.identifier.isiWOS:000302139600072-
dc.identifier.scopus2-s2.0-80053550015-
dc.identifier.rosgroupidr60501-
dc.description.ros2011-2012 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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