Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/443
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dc.contributorDepartment of Applied Physics-
dc.creatorBao, Pen_US
dc.creatorYan, Fen_US
dc.creatorLi, Wen_US
dc.creatorDai, YRen_US
dc.creatorShen, HMen_US
dc.creatorZhu, JSen_US
dc.creatorWang, Yen_US
dc.creatorChan, HLWen_US
dc.creatorChoy, CLen_US
dc.date.accessioned2014-12-11T08:27:42Z-
dc.date.available2014-12-11T08:27:42Z-
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://hdl.handle.net/10397/443-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2002 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in P. Bao et al. Appl. Phys. Lett. 81, 2059 (2002) and may be found at http://link.aip.org/link/?apl/81/2059en_US
dc.subjectLead compoundsen_US
dc.subjectFerroelectric ceramicsen_US
dc.subjectDielectric relaxationen_US
dc.subjectInternal frictionen_US
dc.subjectYoung's modulusen_US
dc.subjectFerroelectric transitionsen_US
dc.subjectSoft modesen_US
dc.titleMechanical properties related to the relaxor-ferroelectric phase transition of titanium-doped lead magnesium niobateen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage2059en_US
dc.identifier.epage2061en_US
dc.identifier.volume81en_US
dc.identifier.issue11en_US
dc.identifier.doi10.1063/1.1498498en_US
dcterms.abstractThe dielectric properties, internal friction, and Young's modulus of (1-x%) Pb(Mg[sub ⅓]Nb[sub ⅔])O₃-x%PbTiO₃ (for x=13, 23, and 33) ceramics have been measured. A phase-transition-like internal friction peak associated with Young's modulus softening has been observed at temperature T[sub R-F], which can be attributed to the relaxor-to-ferroelectrics (R-F) phase transition. Therefore, the R-F phase transition can be explained in terms of the paraelectric-to-ferroelectric phase transition of paraelectric matrix in the materials.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 9 Sept. 2002, v. 81, no. 11, p.2059-2061en_US
dcterms.isPartOfApplied physics lettersen_US
dcterms.issued2002-09-09-
dc.identifier.isiWOS:000177864400042-
dc.identifier.scopus2-s2.0-79956029388-
dc.identifier.eissn1077-3118en_US
dc.identifier.rosgroupidr14845-
dc.description.ros2002-2003 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRA-
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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