Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4236
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dc.contributorDepartment of Applied Physics-
dc.creatorHo, MMT-
dc.creatorTang, TB-
dc.creatorMak, CL-
dc.creatorPang, GKH-
dc.creatorChan, KY-
dc.creatorWong, KH-
dc.date.accessioned2014-12-11T08:24:40Z-
dc.date.available2014-12-11T08:24:40Z-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10397/4236-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in M. M. T. Ho et al., J. Appl. Phys. 100, 083524 (2006) and may be found at http://link.aip.org/link/?jap/100/083524.en_US
dc.subjectStrontium compoundsen_US
dc.subjectBarium compoundsen_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectOptical filmsen_US
dc.subjectSol-gel processingen_US
dc.subjectEllipsometryen_US
dc.subjectAnnealingen_US
dc.subjectX-ray diffractionen_US
dc.subjectTransmission electron microscopyen_US
dc.subjectScanning electron microscopyen_US
dc.subjectGrain sizeen_US
dc.subjectRefractive indexen_US
dc.subjectCrystallisationen_US
dc.subjectExtinction coefficientsen_US
dc.subjectDensificationen_US
dc.subjectGrain boundariesen_US
dc.titleSpectroellipsometric studies of sol-gel derived Sr₀.₆Ba₀.₄Nb₂O₆filmsen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: C. L. Maken_US
dc.description.otherinformationAuthor name used in this publication: G. K. H. Pangen_US
dc.description.otherinformationAuthor name used in this publication: K. H. Wongen_US
dc.identifier.spage1-
dc.identifier.epage5-
dc.identifier.volume100-
dc.identifier.issue8-
dc.identifier.doi10.1063/1.2356916-
dcterms.abstractSr₀.₆Ba₀.₄Nb₂O₆ (SBN) films have been fabricated on (001)Si substrates by a sol-gel technique. The annealing process was carried out in air at various temperatures ranging from 200 to 700 °C. Studies using x-ray diffractometry, high resolution transmission electron microscopy, and scanning electron microscopy showed that polycrystalline films, with a grain size of about 100 nm, were obtained only for annealing temperatures ≥ 600 °C. The optical properties of these sol-gel derived SBN films were studied by spectroscopic ellipsometry (SE). In the analysis of the measured SE spectra, a triple-layer Lorentz model has been developed and used to deduce the optical properties of the SBN films. Our systematic SE measurements revealed that the refractive indices of the SBN films increase with the annealing temperature. This increase is more pronounced at around the crystallization temperature, i.e., between 500 and 600 °C. The extinction coefficients of the films also exhibit a similar trend, showing a zero value for amorphous films and larger values for films annealed at above 600 °C. Our results demonstrate that while crystallization helps to raise the refractive index of the film due to film densification, it also promotes scattering by grain boundary, resulting in a larger extinction coefficient.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 15 Oct. 2006, v. 100, no. 8, 083524, p. 1-5-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2006-10-15-
dc.identifier.isiWOS:000241721900039-
dc.identifier.scopus2-s2.0-33750502637-
dc.identifier.eissn1089-7550-
dc.identifier.rosgroupidr32177-
dc.description.ros2006-2007 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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